Neutron Depolarization Studies of CoCr to study the perpendicular magnetic domain structure

W.H. Kraan; M.Th. Rekveldt; K. Hemmes; J.C. Lodder

doi:10.1016/S0378-4363(86)80112-7

Neutron Depolarization Studies of CoCr to study the perpendicular magnetic domain structure

W.H. Kraan, M.Th. Rekveldt, K. Hemmes, J.C. Lodder

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

Polarised neutrons (l=0.47 nm) are transmitted through sputtered CoCr films. From the measured diagonal elements of the depolarisation matrix it appears that the effective thickness heff of the films is about 50% of the actual thickness. When a soft magnetic NiFe film is deposited before or after deposition of the CoCr, heff is 67 and 60% of the actual thickness respectively, due to the disappearance of the flux closure in the CoCr film. From the angular dependence of the diagonal elements compared with computer simulation the "chain of column" model is supported. Our results indicate that magnetic flux is closed by "branched" spikes at least in the substrate side of the CoCr film.

Original language	English
Pages (from-to)	440-442
Number of pages	3
Journal	Physica B+C
Volume	136B
Issue number	1-3
DOIs	https://doi.org/10.1016/S0378-4363(86)80112-7
Publication status	Published - 1986
Event	International Conference on Neutron Scattering, ICNS 1985 - Santa Fe, United States Duration: 19 Aug 1985 → 23 Aug 1985

Keywords

SMI-MAT: MATERIALS
SMI-TST: From 2006 in EWI-TST

Access to Document

10.1016/S0378-4363(86)80112-7

Kraan86neutronFinal published version, 225 KB

Cite this

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title = "Neutron Depolarization Studies of CoCr to study the perpendicular magnetic domain structure",

abstract = "Polarised neutrons (l=0.47 nm) are transmitted through sputtered CoCr films. From the measured diagonal elements of the depolarisation matrix it appears that the effective thickness heff of the films is about 50% of the actual thickness. When a soft magnetic NiFe film is deposited before or after deposition of the CoCr, heff is 67 and 60% of the actual thickness respectively, due to the disappearance of the flux closure in the CoCr film. From the angular dependence of the diagonal elements compared with computer simulation the {"}chain of column{"} model is supported. Our results indicate that magnetic flux is closed by {"}branched{"} spikes at least in the substrate side of the CoCr film.",

keywords = "SMI-MAT: MATERIALS, SMI-TST: From 2006 in EWI-TST",

author = "W.H. Kraan and M.Th. Rekveldt and K. Hemmes and J.C. Lodder",

year = "1986",

doi = "10.1016/S0378-4363(86)80112-7",

language = "English",

volume = "136B",

pages = "440--442",

journal = "Physica B+C",

issn = "0378-4363",

publisher = "North Holland",

number = "1-3",

note = "International Conference on Neutron Scattering, ICNS 1985, ICNS ; Conference date: 19-08-1985 Through 23-08-1985",

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TY - JOUR

T1 - Neutron Depolarization Studies of CoCr to study the perpendicular magnetic domain structure

AU - Kraan, W.H.

AU - Rekveldt, M.Th.

AU - Hemmes, K.

AU - Lodder, J.C.

PY - 1986

Y1 - 1986

N2 - Polarised neutrons (l=0.47 nm) are transmitted through sputtered CoCr films. From the measured diagonal elements of the depolarisation matrix it appears that the effective thickness heff of the films is about 50% of the actual thickness. When a soft magnetic NiFe film is deposited before or after deposition of the CoCr, heff is 67 and 60% of the actual thickness respectively, due to the disappearance of the flux closure in the CoCr film. From the angular dependence of the diagonal elements compared with computer simulation the "chain of column" model is supported. Our results indicate that magnetic flux is closed by "branched" spikes at least in the substrate side of the CoCr film.

AB - Polarised neutrons (l=0.47 nm) are transmitted through sputtered CoCr films. From the measured diagonal elements of the depolarisation matrix it appears that the effective thickness heff of the films is about 50% of the actual thickness. When a soft magnetic NiFe film is deposited before or after deposition of the CoCr, heff is 67 and 60% of the actual thickness respectively, due to the disappearance of the flux closure in the CoCr film. From the angular dependence of the diagonal elements compared with computer simulation the "chain of column" model is supported. Our results indicate that magnetic flux is closed by "branched" spikes at least in the substrate side of the CoCr film.

KW - SMI-MAT: MATERIALS

KW - SMI-TST: From 2006 in EWI-TST

U2 - 10.1016/S0378-4363(86)80112-7

DO - 10.1016/S0378-4363(86)80112-7

M3 - Article

SN - 0378-4363

VL - 136B

SP - 440

EP - 442

JO - Physica B+C

JF - Physica B+C

IS - 1-3

T2 - International Conference on Neutron Scattering, ICNS 1985

Y2 - 19 August 1985 through 23 August 1985

ER -