New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope

Friedrich Gunther Mugele, A. Rettenberger, J. Boneberg, P. Leiderer

Research output: Contribution to journalArticleAcademic

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Abstract

We present the design of a variable-temperature ultrahigh vacuum (UHV) scanning tunneling microscope which can be operated between 20 and 400 K. The microscope is mounted directly onto the heat exchanger of a He continuous flow cryostat without vibration isolation inside the UHV chamber. The coarse approach is performed with an inertial slider driven by the same piezo tube that is also used for scanning. The performance of the instrument is demonstrated by two different kinds of measurements: First we show topographic images of close packed metal surfaces with atomic resolution. Then, we present results from scanning tunneling spectroscopy measurements on WSe2 under illumination at variable temperatures
Original languageUndefined
Pages (from-to)1765-1769
JournalReview of scientific instruments
Volume69
Issue number4
DOIs
Publication statusPublished - 1998

Keywords

  • IR-57269

Cite this

Mugele, Friedrich Gunther ; Rettenberger, A. ; Boneberg, J. ; Leiderer, P. / New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope. In: Review of scientific instruments. 1998 ; Vol. 69, No. 4. pp. 1765-1769.
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New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope. / Mugele, Friedrich Gunther; Rettenberger, A.; Boneberg, J.; Leiderer, P.

In: Review of scientific instruments, Vol. 69, No. 4, 1998, p. 1765-1769.

Research output: Contribution to journalArticleAcademic

TY - JOUR

T1 - New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope

AU - Mugele, Friedrich Gunther

AU - Rettenberger, A.

AU - Boneberg, J.

AU - Leiderer, P.

PY - 1998

Y1 - 1998

N2 - We present the design of a variable-temperature ultrahigh vacuum (UHV) scanning tunneling microscope which can be operated between 20 and 400 K. The microscope is mounted directly onto the heat exchanger of a He continuous flow cryostat without vibration isolation inside the UHV chamber. The coarse approach is performed with an inertial slider driven by the same piezo tube that is also used for scanning. The performance of the instrument is demonstrated by two different kinds of measurements: First we show topographic images of close packed metal surfaces with atomic resolution. Then, we present results from scanning tunneling spectroscopy measurements on WSe2 under illumination at variable temperatures

AB - We present the design of a variable-temperature ultrahigh vacuum (UHV) scanning tunneling microscope which can be operated between 20 and 400 K. The microscope is mounted directly onto the heat exchanger of a He continuous flow cryostat without vibration isolation inside the UHV chamber. The coarse approach is performed with an inertial slider driven by the same piezo tube that is also used for scanning. The performance of the instrument is demonstrated by two different kinds of measurements: First we show topographic images of close packed metal surfaces with atomic resolution. Then, we present results from scanning tunneling spectroscopy measurements on WSe2 under illumination at variable temperatures

KW - IR-57269

U2 - 10.1063/1.1148839

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M3 - Article

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EP - 1769

JO - Review of scientific instruments

JF - Review of scientific instruments

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