New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope

Friedrich Gunther Mugele, A. Rettenberger, J. Boneberg, P. Leiderer

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Abstract

We present the design of a variable-temperature ultrahigh vacuum (UHV) scanning tunneling microscope which can be operated between 20 and 400 K. The microscope is mounted directly onto the heat exchanger of a He continuous flow cryostat without vibration isolation inside the UHV chamber. The coarse approach is performed with an inertial slider driven by the same piezo tube that is also used for scanning. The performance of the instrument is demonstrated by two different kinds of measurements: First we show topographic images of close packed metal surfaces with atomic resolution. Then, we present results from scanning tunneling spectroscopy measurements on WSe2 under illumination at variable temperatures
Original languageUndefined
Pages (from-to)1765-1769
JournalReview of scientific instruments
Volume69
Issue number4
DOIs
Publication statusPublished - 1998

Keywords

  • IR-57269

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