New imaging mode in atomic-force microscopy based on the error signal

Constant A.J. Putman; Kees O. van der Werf; Bart G. de Grooth; Niko F. van Hulst; Jan Greve; Paul K. Hansma

doi:10.1117/12.58191

New imaging mode in atomic-force microscopy based on the error signal

Constant A.J. Putman, Kees O. van der Werf, Bart G. de Grooth, Niko F. van Hulst, Jan Greve, Paul K. Hansma

Optical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

108 Citations (Scopus)

Abstract

A new imaging mode, the error signal mode, is introduced to atomic force microscopy. In this mode, the error signal is displayed while imaging in the height mode. The feedback loop serves as a high-pass filter that filters out the low spatial frequency components of the surface, leaving only the high spatial frequency components of the surface to contribute to the error signal and to be displayed. At a scan rate of typically 10 lines per second, images taken in this mode show very fine detail. Since the applied force stays nearly constant, the error signal mode is especially suitable for imaging soft biological samples with a high level of detail without damaging the surface.

Original language	English
Title of host publication	Scanning Probe Microscopies
Editors	Srinivas Manne
Place of Publication	Los Angeles, CA
Publisher	SPIE
Pages	198-204
Number of pages	7
ISBN (Print)	0-8194-0785-2
DOIs	https://doi.org/10.1117/12.58191
Publication status	Published - 20 Jan 1992
Event	SPIE OE/LASE 1992 - Los Angeles, United States Duration: 19 Jan 1992 → 24 Jan 1992

Publication series

Name	Proceedings of Spie
Volume	1639

Conference

Conference	SPIE OE/LASE 1992
Abbreviated title	OE/LASE
Country/Territory	United States
City	Los Angeles
Period	19/01/92 → 24/01/92

Keywords

IR-25714
METIS-130517

Access to Document

10.1117/12.58191

Cite this

@inproceedings{1105f1db41634ecf805387e3e6360496,

title = "New imaging mode in atomic-force microscopy based on the error signal",

abstract = "A new imaging mode, the error signal mode, is introduced to atomic force microscopy. In this mode, the error signal is displayed while imaging in the height mode. The feedback loop serves as a high-pass filter that filters out the low spatial frequency components of the surface, leaving only the high spatial frequency components of the surface to contribute to the error signal and to be displayed. At a scan rate of typically 10 lines per second, images taken in this mode show very fine detail. Since the applied force stays nearly constant, the error signal mode is especially suitable for imaging soft biological samples with a high level of detail without damaging the surface.",

keywords = "IR-25714, METIS-130517",

author = "Putman, {Constant A.J.} and {van der Werf}, {Kees O.} and {de Grooth}, {Bart G.} and {van Hulst}, {Niko F.} and Jan Greve and Hansma, {Paul K.}",

year = "1992",

month = jan,

day = "20",

doi = "10.1117/12.58191",

language = "English",

isbn = "0-8194-0785-2",

series = "Proceedings of Spie",

publisher = "SPIE",

pages = "198--204",

editor = "Srinivas Manne",

booktitle = "Scanning Probe Microscopies",

address = "United States",

note = "SPIE OE/LASE 1992, OE/LASE ; Conference date: 19-01-1992 Through 24-01-1992",

}

Putman, CAJ, van der Werf, KO, de Grooth, BG, van Hulst, NF, Greve, J & Hansma, PK 1992, New imaging mode in atomic-force microscopy based on the error signal. in S Manne (ed.), Scanning Probe Microscopies. Proceedings of Spie, vol. 1639, SPIE, Los Angeles, CA, pp. 198-204, SPIE OE/LASE 1992, Los Angeles, California, United States, 19/01/92. https://doi.org/10.1117/12.58191

New imaging mode in atomic-force microscopy based on the error signal. / Putman, Constant A.J.; van der Werf, Kees O.; de Grooth, Bart G. et al.
Scanning Probe Microscopies. ed. / Srinivas Manne. Los Angeles, CA: SPIE, 1992. p. 198-204 (Proceedings of Spie; Vol. 1639).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - New imaging mode in atomic-force microscopy based on the error signal

AU - Putman, Constant A.J.

AU - van der Werf, Kees O.

AU - de Grooth, Bart G.

AU - van Hulst, Niko F.

AU - Greve, Jan

AU - Hansma, Paul K.

PY - 1992/1/20

Y1 - 1992/1/20

N2 - A new imaging mode, the error signal mode, is introduced to atomic force microscopy. In this mode, the error signal is displayed while imaging in the height mode. The feedback loop serves as a high-pass filter that filters out the low spatial frequency components of the surface, leaving only the high spatial frequency components of the surface to contribute to the error signal and to be displayed. At a scan rate of typically 10 lines per second, images taken in this mode show very fine detail. Since the applied force stays nearly constant, the error signal mode is especially suitable for imaging soft biological samples with a high level of detail without damaging the surface.

AB - A new imaging mode, the error signal mode, is introduced to atomic force microscopy. In this mode, the error signal is displayed while imaging in the height mode. The feedback loop serves as a high-pass filter that filters out the low spatial frequency components of the surface, leaving only the high spatial frequency components of the surface to contribute to the error signal and to be displayed. At a scan rate of typically 10 lines per second, images taken in this mode show very fine detail. Since the applied force stays nearly constant, the error signal mode is especially suitable for imaging soft biological samples with a high level of detail without damaging the surface.

KW - IR-25714

KW - METIS-130517

U2 - 10.1117/12.58191

DO - 10.1117/12.58191

M3 - Conference contribution

SN - 0-8194-0785-2

T3 - Proceedings of Spie

SP - 198

EP - 204

BT - Scanning Probe Microscopies

A2 - Manne, Srinivas

PB - SPIE

CY - Los Angeles, CA

T2 - SPIE OE/LASE 1992

Y2 - 19 January 1992 through 24 January 1992

ER -

New imaging mode in atomic-force microscopy based on the error signal

Abstract

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Conference

Keywords

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Cite this