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New imaging mode in atomic-force microscopy based on the error signal
Constant A.J. Putman, Kees O. van der Werf, Bart G. de Grooth, Niko F. van Hulst, Jan Greve, Paul K. Hansma
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
108
Citations
(Scopus)