New View Requirements for Analogue/MS IPs for Dependability Optimization in Heterogeneous SoC Design

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    Abstract

    Nowadays, safety-critical systems in for instance the automotive industry routinely consist of complex Systems-on-Chip in increasingly advanced processes. The decreased reliability for advanced processes, along with the harsh environmental conditions in cars, causes serious concerns for the dependability of those SoCs. For this reason, some digital IP vendors for those systems are already starting to incorporate additional information on IPs to system designers, for instance to include safety parameters. This provides system designers with a possibility to optimize/guarantee their design along an additional design axis (e.g. safety). As most automotive SoCs incorporate analogue front/back-ends, a similar requirement would also have to be included for analogue/mixed-signal IPs. Because of limited robustness, and a variety of parameters, this has not been considered for analogue/mixed-signal IPs yet. This paper presents a first step towards the introduction of a dependability view for analogue/mixed-signal IPs, and an investigation which benefits like increased dependability could be expected at system level.
    Original languageUndefined
    Title of host publication17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Pages5-11
    Number of pages6
    ISBN (Print)978-0-7695-4479-3
    DOIs
    Publication statusPublished - 16 May 2011
    Event17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011 - Hotel Mar Monte, Santa Barbara, United States
    Duration: 16 May 201118 May 2011
    Conference number: 17

    Publication series

    NameProceedings IMS3TW
    PublisherIEEE Computer Society

    Workshop

    Workshop17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011
    Abbreviated titleIMS3TW
    CountryUnited States
    CitySanta Barbara
    Period16/05/1118/05/11

    Keywords

    • METIS-284960
    • Dependability
    • MS-IP specification
    • Availability
    • safety
    • Reliability
    • Fault Tolerance
    • CAES-TDT: Testable Design and Test
    • EWI-21155
    • IR-79217

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