NiAl seed layer for obliquely sputtered thin-film tape

L.T. Nguyen, A. Hozoi, J.C. Lodder

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

Two types of magnetic tape were produced by oblique sputtering with the incident angle of 65 + or - 5 degrees . One consists of a 180-nm Cr underlayer layer and 20-nm Co layer. The other consists of a 90-nm NiAl seed layer, 90-nm Cr intermediate layer, and 20-nm Co layer. It is shown that the use of NiAl seed layer allows further reduction of the Co grain size and improves the film smoothness. The fine microstructure obtained in the NiAl seed layer resulted in smaller Co grains with more uniform size distribution. This caused the switching field distribution to become narrower, while the values of the squareness and coercivity remained high. The recording performances were also improved for the tape with NiAl seed layer.
Original languageUndefined
Pages (from-to)2401-2403
Number of pages3
JournalIEEE transactions on magnetics
Volume40
Issue number4/4
DOIs
Publication statusPublished - 2004

Keywords

  • IR-47379
  • METIS-217782
  • SMI-TST: From 2006 in EWI-TST
  • SMI-MAT: MATERIALS
  • EWI-5602

Cite this

Nguyen, L.T. ; Hozoi, A. ; Lodder, J.C. / NiAl seed layer for obliquely sputtered thin-film tape. In: IEEE transactions on magnetics. 2004 ; Vol. 40, No. 4/4. pp. 2401-2403.
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abstract = "Two types of magnetic tape were produced by oblique sputtering with the incident angle of 65 + or - 5 degrees . One consists of a 180-nm Cr underlayer layer and 20-nm Co layer. The other consists of a 90-nm NiAl seed layer, 90-nm Cr intermediate layer, and 20-nm Co layer. It is shown that the use of NiAl seed layer allows further reduction of the Co grain size and improves the film smoothness. The fine microstructure obtained in the NiAl seed layer resulted in smaller Co grains with more uniform size distribution. This caused the switching field distribution to become narrower, while the values of the squareness and coercivity remained high. The recording performances were also improved for the tape with NiAl seed layer.",
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author = "L.T. Nguyen and A. Hozoi and J.C. Lodder",
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year = "2004",
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journal = "IEEE transactions on magnetics",
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NiAl seed layer for obliquely sputtered thin-film tape. / Nguyen, L.T.; Hozoi, A.; Lodder, J.C.

In: IEEE transactions on magnetics, Vol. 40, No. 4/4, 2004, p. 2401-2403.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - NiAl seed layer for obliquely sputtered thin-film tape

AU - Nguyen, L.T.

AU - Hozoi, A.

AU - Lodder, J.C.

N1 - Imported from SMI Reference manager

PY - 2004

Y1 - 2004

N2 - Two types of magnetic tape were produced by oblique sputtering with the incident angle of 65 + or - 5 degrees . One consists of a 180-nm Cr underlayer layer and 20-nm Co layer. The other consists of a 90-nm NiAl seed layer, 90-nm Cr intermediate layer, and 20-nm Co layer. It is shown that the use of NiAl seed layer allows further reduction of the Co grain size and improves the film smoothness. The fine microstructure obtained in the NiAl seed layer resulted in smaller Co grains with more uniform size distribution. This caused the switching field distribution to become narrower, while the values of the squareness and coercivity remained high. The recording performances were also improved for the tape with NiAl seed layer.

AB - Two types of magnetic tape were produced by oblique sputtering with the incident angle of 65 + or - 5 degrees . One consists of a 180-nm Cr underlayer layer and 20-nm Co layer. The other consists of a 90-nm NiAl seed layer, 90-nm Cr intermediate layer, and 20-nm Co layer. It is shown that the use of NiAl seed layer allows further reduction of the Co grain size and improves the film smoothness. The fine microstructure obtained in the NiAl seed layer resulted in smaller Co grains with more uniform size distribution. This caused the switching field distribution to become narrower, while the values of the squareness and coercivity remained high. The recording performances were also improved for the tape with NiAl seed layer.

KW - IR-47379

KW - METIS-217782

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-MAT: MATERIALS

KW - EWI-5602

U2 - 10.1109/TMAG.2004.829816

DO - 10.1109/TMAG.2004.829816

M3 - Article

VL - 40

SP - 2401

EP - 2403

JO - IEEE transactions on magnetics

JF - IEEE transactions on magnetics

SN - 0018-9464

IS - 4/4

ER -