NiAl seed layer for obliquely sputtered thin-film tape

L.T. Nguyen, A. Hozoi, J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    Abstract

    Two types of magnetic tape were produced by oblique sputtering with the incident angle of 65 + or - 5 degrees . One consists of a 180-nm Cr underlayer layer and 20-nm Co layer. The other consists of a 90-nm NiAl seed layer, 90-nm Cr intermediate layer, and 20-nm Co layer. It is shown that the use of NiAl seed layer allows further reduction of the Co grain size and improves the film smoothness. The fine microstructure obtained in the NiAl seed layer resulted in smaller Co grains with more uniform size distribution. This caused the switching field distribution to become narrower, while the values of the squareness and coercivity remained high. The recording performances were also improved for the tape with NiAl seed layer.
    Original languageUndefined
    Pages (from-to)2401-2403
    Number of pages3
    JournalIEEE transactions on magnetics
    Volume40
    Issue number4/4
    DOIs
    Publication statusPublished - 2004

    Keywords

    • IR-47379
    • METIS-217782
    • SMI-TST: From 2006 in EWI-TST
    • SMI-MAT: MATERIALS
    • EWI-5602

    Cite this

    Nguyen, L.T. ; Hozoi, A. ; Lodder, J.C. / NiAl seed layer for obliquely sputtered thin-film tape. In: IEEE transactions on magnetics. 2004 ; Vol. 40, No. 4/4. pp. 2401-2403.
    @article{a4ea117c7282403d8f336924294b862d,
    title = "NiAl seed layer for obliquely sputtered thin-film tape",
    abstract = "Two types of magnetic tape were produced by oblique sputtering with the incident angle of 65 + or - 5 degrees . One consists of a 180-nm Cr underlayer layer and 20-nm Co layer. The other consists of a 90-nm NiAl seed layer, 90-nm Cr intermediate layer, and 20-nm Co layer. It is shown that the use of NiAl seed layer allows further reduction of the Co grain size and improves the film smoothness. The fine microstructure obtained in the NiAl seed layer resulted in smaller Co grains with more uniform size distribution. This caused the switching field distribution to become narrower, while the values of the squareness and coercivity remained high. The recording performances were also improved for the tape with NiAl seed layer.",
    keywords = "IR-47379, METIS-217782, SMI-TST: From 2006 in EWI-TST, SMI-MAT: MATERIALS, EWI-5602",
    author = "L.T. Nguyen and A. Hozoi and J.C. Lodder",
    note = "Imported from SMI Reference manager",
    year = "2004",
    doi = "10.1109/TMAG.2004.829816",
    language = "Undefined",
    volume = "40",
    pages = "2401--2403",
    journal = "IEEE transactions on magnetics",
    issn = "0018-9464",
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    NiAl seed layer for obliquely sputtered thin-film tape. / Nguyen, L.T.; Hozoi, A.; Lodder, J.C.

    In: IEEE transactions on magnetics, Vol. 40, No. 4/4, 2004, p. 2401-2403.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - NiAl seed layer for obliquely sputtered thin-film tape

    AU - Nguyen, L.T.

    AU - Hozoi, A.

    AU - Lodder, J.C.

    N1 - Imported from SMI Reference manager

    PY - 2004

    Y1 - 2004

    N2 - Two types of magnetic tape were produced by oblique sputtering with the incident angle of 65 + or - 5 degrees . One consists of a 180-nm Cr underlayer layer and 20-nm Co layer. The other consists of a 90-nm NiAl seed layer, 90-nm Cr intermediate layer, and 20-nm Co layer. It is shown that the use of NiAl seed layer allows further reduction of the Co grain size and improves the film smoothness. The fine microstructure obtained in the NiAl seed layer resulted in smaller Co grains with more uniform size distribution. This caused the switching field distribution to become narrower, while the values of the squareness and coercivity remained high. The recording performances were also improved for the tape with NiAl seed layer.

    AB - Two types of magnetic tape were produced by oblique sputtering with the incident angle of 65 + or - 5 degrees . One consists of a 180-nm Cr underlayer layer and 20-nm Co layer. The other consists of a 90-nm NiAl seed layer, 90-nm Cr intermediate layer, and 20-nm Co layer. It is shown that the use of NiAl seed layer allows further reduction of the Co grain size and improves the film smoothness. The fine microstructure obtained in the NiAl seed layer resulted in smaller Co grains with more uniform size distribution. This caused the switching field distribution to become narrower, while the values of the squareness and coercivity remained high. The recording performances were also improved for the tape with NiAl seed layer.

    KW - IR-47379

    KW - METIS-217782

    KW - SMI-TST: From 2006 in EWI-TST

    KW - SMI-MAT: MATERIALS

    KW - EWI-5602

    U2 - 10.1109/TMAG.2004.829816

    DO - 10.1109/TMAG.2004.829816

    M3 - Article

    VL - 40

    SP - 2401

    EP - 2403

    JO - IEEE transactions on magnetics

    JF - IEEE transactions on magnetics

    SN - 0018-9464

    IS - 4/4

    ER -