Noise and resolution in IO interferometric sensing

Hugo Hoekstra, Paul Lambeck, T.M. Koster, H.P. Uranus

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    Abstract

    The paper presents a general theory for sensing devices, relating noise and device parameters to resolution of modal index changes. The theory is applied to optimise the length of a few integrated optics sensing devices, being a Mac-Zehnder interferometers and two Fabry-Perot implementations. The results enable the determination of the maximum attainable resolution, and show the crucial importance of loss.
    Original languageUndefined
    Title of host publicationProceedings European Conference on Integrated Optics (ECIO)
    Place of PublicationCopenhagen, Denmark
    PublisherTechnical University of Denmark
    PagesWH5
    Number of pages4
    ISBN (Print)not assigned
    Publication statusPublished - 27 Apr 2007
    Event13th European Conference on Integrated Optics, ECIO 2007 - Copenhagen, Netherlands
    Duration: 25 Apr 200727 Apr 2007
    Conference number: 13

    Publication series

    Name
    PublisherTechnical University of Denmark
    NumberLNCS4549

    Conference

    Conference13th European Conference on Integrated Optics, ECIO 2007
    Abbreviated titleECIO
    CountryNetherlands
    CityCopenhagen
    Period25/04/0727/04/07

    Keywords

    • IOMS-SNS: SENSORS
    • METIS-241946
    • EWI-11136
    • IR-64376

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