Noise in (double) relaxation oscillation SQUIDs

Derk Jan Adelerhof; Jaap Flokstra; Horst Rogalla

doi:10.1016/0921-4526(94)90400-6

Noise in (double) relaxation oscillation SQUIDs

Derk Jan Adelerhof, Jaap Flokstra, Horst Rogalla

Faculty of Science and Technology

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Abstract

We have modelled the effect of two intrinsic noise sources on the flux noise spectral density of (Double) Relaxation Oscillation SQUIDs ((D)ROSs) based on hysteretic Josephson tunnel junctions. An important noise source is the spread in the critical current of the SQUID due to thermal fluctuations. Critical current noise mainly determines the noise on the average output voltage of DROSs with high flux to voltage transfer. A second noise source is the spread in the relaxation frequency due to the random interaction between the Josephson oscillations and the relaxation oscillations during switching to the zero-voltage state. This effect can dominate the voltage noise of a ROS.

Original language	English
Pages (from-to)	141-142
Number of pages	2
Journal	Physica B
Volume	194
Issue number	1
DOIs	https://doi.org/10.1016/0921-4526(94)90400-6
Publication status	Published - 1994

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title = "Noise in (double) relaxation oscillation SQUIDs",

abstract = "We have modelled the effect of two intrinsic noise sources on the flux noise spectral density of (Double) Relaxation Oscillation SQUIDs ((D)ROSs) based on hysteretic Josephson tunnel junctions. An important noise source is the spread in the critical current of the SQUID due to thermal fluctuations. Critical current noise mainly determines the noise on the average output voltage of DROSs with high flux to voltage transfer. A second noise source is the spread in the relaxation frequency due to the random interaction between the Josephson oscillations and the relaxation oscillations during switching to the zero-voltage state. This effect can dominate the voltage noise of a ROS.",

author = "Adelerhof, {Derk Jan} and Jaap Flokstra and Horst Rogalla",

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T1 - Noise in (double) relaxation oscillation SQUIDs

AU - Adelerhof, Derk Jan

AU - Flokstra, Jaap

AU - Rogalla, Horst

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N2 - We have modelled the effect of two intrinsic noise sources on the flux noise spectral density of (Double) Relaxation Oscillation SQUIDs ((D)ROSs) based on hysteretic Josephson tunnel junctions. An important noise source is the spread in the critical current of the SQUID due to thermal fluctuations. Critical current noise mainly determines the noise on the average output voltage of DROSs with high flux to voltage transfer. A second noise source is the spread in the relaxation frequency due to the random interaction between the Josephson oscillations and the relaxation oscillations during switching to the zero-voltage state. This effect can dominate the voltage noise of a ROS.

AB - We have modelled the effect of two intrinsic noise sources on the flux noise spectral density of (Double) Relaxation Oscillation SQUIDs ((D)ROSs) based on hysteretic Josephson tunnel junctions. An important noise source is the spread in the critical current of the SQUID due to thermal fluctuations. Critical current noise mainly determines the noise on the average output voltage of DROSs with high flux to voltage transfer. A second noise source is the spread in the relaxation frequency due to the random interaction between the Josephson oscillations and the relaxation oscillations during switching to the zero-voltage state. This effect can dominate the voltage noise of a ROS.

U2 - 10.1016/0921-4526(94)90400-6

DO - 10.1016/0921-4526(94)90400-6

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SP - 141

EP - 142

JO - Physica B

JF - Physica B

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ER -

Noise in (double) relaxation oscillation SQUIDs

Abstract

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