Noise spectroscopy of traps in silicon nanowire field-effect transistors

S. Pud*, J. Li, M. Petrychuk, S. Feste, A. Offenhausser, S. Mantl, S. Vitusevich

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

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Engineering & Materials Science