Non-invasive Identification of a Degraded Passive Filter Component

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

36 Downloads (Pure)

Abstract

The development of modern technology makes the use of low-pass filters increasingly necessary to protect sensitive equipment from the impact of high-frequency noise. However, filters are often exposed to harsh operating conditions that can cause a significant influence on the condition of the filter components themselves. Affecting any element of the filter will result in a change in the performance of the filter as a whole. Therefore, it is possible to determine the nature of changes that occurred in a damaged filter from the changes in its performance. This paper presents an application of the previously proposed method for identifying the culprit filter component using a simple combination of measurements and simulations. A simple filter, in which one component was changed to mimic its degradation, was selected as a case study. Measurements in common mode were made to estimate the magnitude of that effect in terms of insertion loss (IL). Monte Carlo simulations with variable component values were performed to fit the IL of the damaged filter and identify the culprit component. It is shown that the proposed approach can be used as a tool for finding the possible cause of changes due to filter damage.
Original languageEnglish
Title of host publicationIEEE International Symposium On Electromagnetic Compatibility, Signal & Power Integrity, EMC+SIPI 2023
Number of pages5
ISBN (Electronic)979-8-3503-0976-8
Publication statusAccepted/In press - 2023
Event
IEEE International Symposium On Electromagnetic Compatibility, Signal & Power Integrity, EMC+SIPI 2023
- Grand Rapids, United States
Duration: 31 Jul 20234 Aug 2023
https://emc2023.org/

Conference

Conference
IEEE International Symposium On Electromagnetic Compatibility, Signal & Power Integrity, EMC+SIPI 2023
Abbreviated titleEMC+SIPI 2023
Country/TerritoryUnited States
CityGrand Rapids
Period31/07/234/08/23
Internet address

Keywords

  • Insertion loss
  • Measurements
  • Element degradation
  • Low-Pass Filter (LPF)
  • Simulation

Fingerprint

Dive into the research topics of 'Non-invasive Identification of a Degraded Passive Filter Component'. Together they form a unique fingerprint.

Cite this