Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction

Colin Ophus, Peter Ercius, Mark Huijben, Jim Ciston

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

Abstract

The local atomic structure of a crystalline sample aligned along a zone axis can be probed with a focused electron probe, which produces a convergent beam electron diffraction pattern. The introduction of high speed direct electron detectors has allowed for experiments that can record a full diffraction pattern image at thousands of probe positions on a sample. By incoherently summing these patterns over crystalline unit cells, we demonstrate that in addition to crystal structure and thickness, we can also estimate the local composition of a perovskite superlattice sample. This is achieved by matching the summed patterns to a library of simulated diffraction patterns. This technique allows for atomic-scale chemical measurements without requiring a spectrometer or hardware aberration correction.

Original languageEnglish
Article number063102
JournalApplied physics letters
Volume110
Issue number6
DOIs
Publication statusPublished - 6 Feb 2017

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diffraction patterns
electron diffraction
scanning
electron counters
electron probes
atomic structure
aberration
hardware
high speed
spectrometers
crystal structure
probes
estimates
cells

Cite this

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Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction. / Ophus, Colin; Ercius, Peter; Huijben, Mark; Ciston, Jim.

In: Applied physics letters, Vol. 110, No. 6, 063102, 06.02.2017.

Research output: Contribution to journalArticleAcademicpeer-review

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T1 - Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction

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AU - Ercius, Peter

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AU - Ciston, Jim

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AB - The local atomic structure of a crystalline sample aligned along a zone axis can be probed with a focused electron probe, which produces a convergent beam electron diffraction pattern. The introduction of high speed direct electron detectors has allowed for experiments that can record a full diffraction pattern image at thousands of probe positions on a sample. By incoherently summing these patterns over crystalline unit cells, we demonstrate that in addition to crystal structure and thickness, we can also estimate the local composition of a perovskite superlattice sample. This is achieved by matching the summed patterns to a library of simulated diffraction patterns. This technique allows for atomic-scale chemical measurements without requiring a spectrometer or hardware aberration correction.

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