Nonhomogeneous poisson process for reverberant and semi-reverberant environment characterization

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)

    Abstract

    Abstract—We develop and evaluate a method to estimate the cumulative intensity function of nonhomogeneous Poisson processes (NHPP) observed in different configurations of a reverberation chamber. The counting data collects the number of different anomalous statistics occurrences as a function of the frequency of operation inside a reverberation chamber. To approximate the mean-value function, the method proposes a mathematical model for the rate function. An experimental performance evaluation for six typical test problems demonstrates the method’s ability to yield an accurate fit to NHPP present in different semi-reverberant environments.
    Original languageUndefined
    Title of host publication10th International Symposium on Electromagnetic Compatibility (EMC Europe 2011)
    Place of PublicationUSA
    PublisherIEEE Electromagnetic Compatibility Society
    Pages180-185
    Number of pages6
    ISBN (Print)978-0-9541146-3-3
    Publication statusPublished - 29 Sep 2011
    EventEMC Europe 2011: International Symposium on Electromagnetic Compatibility - York, UK, York, United Kingdom
    Duration: 26 Sep 201130 Sep 2011

    Publication series

    Name
    PublisherIEEE Electromagnetic Compatibility Society

    Conference

    ConferenceEMC Europe 2011
    CountryUnited Kingdom
    CityYork
    Period26/09/1130/09/11
    OtherSeptember 26-30, 2011

    Keywords

    • METIS-278870
    • IR-78187
    • EC Grant Agreement nr.: FP7/2007-2013
    • EC Grant Agreement nr.: FP7/205294
    • EWI-20626

    Cite this

    Serra, R., Leferink, F. B. J., & Canavero, F. (2011). Nonhomogeneous poisson process for reverberant and semi-reverberant environment characterization. In 10th International Symposium on Electromagnetic Compatibility (EMC Europe 2011) (pp. 180-185). USA: IEEE Electromagnetic Compatibility Society.