Nonparametric control charts for bivariate high-quality processes

Willem Albers

    Research output: Book/ReportReportProfessional

    1 Citation (Scopus)
    59 Downloads (Pure)

    Abstract

    For attribute data with (very) low rates of defectives, attractive control charts can be based on the maximum of subsequent groups of r failure times, for some suitable r≥1, like r=5. Such charts combine good performance with often highly needed robustness, as they allow a nonparametric adaptation already for Phase I samples of ordinary size. In the present paper we address the problem of extending this approach to the situation where two characteristics have to be monitored simultaneously. Generalization to the multivariate case is straightforward.
    Original languageEnglish
    Place of PublicationEnschede
    PublisherUniversity of Twente
    Number of pages11
    Publication statusPublished - Jun 2012

    Publication series

    NameMemorandum
    PublisherUniversity of Twente, Department of Applied Mathematics
    No.1984
    ISSN (Print)1874-4850

    Keywords

    • Order statistics
    • Statistical process control
    • Estimated parameters
    • Health care monitoring
    • Average run length
    • MSC-62P10

    Fingerprint

    Dive into the research topics of 'Nonparametric control charts for bivariate high-quality processes'. Together they form a unique fingerprint.

    Cite this