Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors

O. Parriaux; G.J. Veldhuis

doi:10.1109/50.664066

Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors

O. Parriaux
, G.J. Veldhuis

Research output: Contribution to journal › Article › Academic › peer-review

160 Citations (Scopus)

331 Downloads (Pure)

Abstract

Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface

Original language	English
Pages (from-to)	573-582
Number of pages	12
Journal	Journal of lightwave technology
Volume	16
Issue number	4
DOIs	https://doi.org/10.1109/50.664066
Publication status	Published - 1998

Keywords

n/a OA procedure
Refractometers
Optical planar waveguides
Sensitivity analysis
Biosensors
Chemical sensors

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10.1109/50.664066

Cite this

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title = "Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors",

abstract = "Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface",

keywords = "n/a OA procedure, Refractometers, Optical planar waveguides, Sensitivity analysis, Biosensors, Chemical sensors",

author = "O. Parriaux and G.J. Veldhuis",

year = "1998",

doi = "10.1109/50.664066",

language = "English",

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pages = "573--582",

journal = "Journal of lightwave technology",

issn = "0733-8724",

publisher = "IEEE",

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T1 - Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors

AU - Parriaux, O.

AU - Veldhuis, G.J.

PY - 1998

Y1 - 1998

N2 - Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface

AB - Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface

KW - n/a OA procedure

KW - Refractometers

KW - Optical planar waveguides

KW - Sensitivity analysis

KW - Biosensors

KW - Chemical sensors

U2 - 10.1109/50.664066

DO - 10.1109/50.664066

M3 - Article

SN - 0733-8724

VL - 16

SP - 573

EP - 582

JO - Journal of lightwave technology

JF - Journal of lightwave technology

IS - 4

ER -

Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors

Abstract

Keywords

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