Nucleation control for high quality polycrystalline GExSI1-x thin film transistors

J.B. Rem, J. Holleman, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 25th European Solid State Device Research Conference, ESSDERC'95
    Place of PublicationThe Netherlands Congress Centre, The Hague
    Publication statusPublished - 25 Sept 1995


    • METIS-113986

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