Numerical analysis of ITER TF samples with different cabling pattern based on joint interstrand resistance measurement

E.P.A. van Lanen, Arend Nijhuis

Research output: Contribution to conferencePoster

Original languageEnglish
Pages-
Publication statusPublished - 12 Sep 2011
Event22nd International Conference on Magnet Technology, MT-22 2011 - Marseilles, France
Duration: 12 Sep 201116 Sep 2011
Conference number: 22

Conference

Conference22nd International Conference on Magnet Technology, MT-22 2011
Abbreviated titleMT
CountryFrance
CityMarseilles
Period12/09/1116/09/11

Keywords

  • METIS-281198

Cite this

van Lanen, E. P. A., & Nijhuis, A. (2011). Numerical analysis of ITER TF samples with different cabling pattern based on joint interstrand resistance measurement. -. Poster session presented at 22nd International Conference on Magnet Technology, MT-22 2011, Marseilles, France.