Numerical analysis of the DC performance of ITER TF samples with different cabling pattern based on resistance measurements on terminations

E.P.A. van Lanen, Arend Nijhuis

Research output: Contribution to journalArticleAcademicpeer-review

12 Citations (Scopus)
Original languageUndefined
Article number085010
Pages (from-to)-
Number of pages8
JournalSuperconductor science and technology
Volume24
Issue number8
DOIs
Publication statusPublished - 2011

Keywords

  • METIS-281076

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