Obliquely sputtered Co/Cr thin film tape for bidirectional recording

L.T. Nguyen, A. Lisfi, J.C. Lodder

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    4 Citations (Scopus)
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    Abstract

    We report the growth and properties of a thin film tape, which can be equivalently recorded in both directions. The experimental tape consists of a 20 nm thick Co layer grown on top of a Cr underlayer 120 nm. The two layers were consecutively sputtered at incident angle of 70° at room temperature onto a rotating drum covered with a polymer substrate. In such growth geometry the running direction of drum is perpendicular to the incidence plane of arriving atoms. As a result of this configuration, a medium with a good orientation of the easy axis along the recording direction as well as a high coercivity of 180 kA/m has been prepared. Recording measurements have been carried out and illustrate the bidirectional recording behavior of this experimental tape, which seems to be very promising for high-density tape recording.
    Original languageEnglish
    Pages (from-to)7786-7788
    Number of pages3
    JournalJournal of Applied Physics
    Volume93
    Issue number10
    DOIs
    Publication statusPublished - 2003

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • SMI-MAT: MATERIALS

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