Obliquely sputtered Co/Cr thin film tape for bidirectional recording

L.T. Nguyen, A. Lisfi, J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    4 Citations (Scopus)

    Abstract

    We report the growth and properties of a thin film tape, which can be equivalently recorded in both directions. The experimental tape consists of a 20 nm thick Co layer grown on top of a Cr underlayer 120 nm. The two layers were consecutively sputtered at incident angle of 70° at room temperature onto a rotating drum covered with a polymer substrate. In such growth geometry the running direction of drum is perpendicular to the incidence plane of arriving atoms. As a result of this configuration, a medium with a good orientation of the easy axis along the recording direction as well as a high coercivity of 180 kA/m has been prepared. Recording measurements have been carried out and illustrate the bidirectional recording behavior of this experimental tape, which seems to be very promising for high-density tape recording.
    Original languageUndefined
    Pages (from-to)7786-7788
    Number of pages3
    JournalJournal of applied physics
    Volume93
    Issue number10
    Publication statusPublished - 2003

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • IR-63018
    • SMI-MAT: MATERIALS
    • EWI-5603

    Cite this

    Nguyen, L. T., Lisfi, A., & Lodder, J. C. (2003). Obliquely sputtered Co/Cr thin film tape for bidirectional recording. Journal of applied physics, 93(10), 7786-7788.
    Nguyen, L.T. ; Lisfi, A. ; Lodder, J.C. / Obliquely sputtered Co/Cr thin film tape for bidirectional recording. In: Journal of applied physics. 2003 ; Vol. 93, No. 10. pp. 7786-7788.
    @article{65390067036040f08d9a21f7a59b1f96,
    title = "Obliquely sputtered Co/Cr thin film tape for bidirectional recording",
    abstract = "We report the growth and properties of a thin film tape, which can be equivalently recorded in both directions. The experimental tape consists of a 20 nm thick Co layer grown on top of a Cr underlayer 120 nm. The two layers were consecutively sputtered at incident angle of 70° at room temperature onto a rotating drum covered with a polymer substrate. In such growth geometry the running direction of drum is perpendicular to the incidence plane of arriving atoms. As a result of this configuration, a medium with a good orientation of the easy axis along the recording direction as well as a high coercivity of 180 kA/m has been prepared. Recording measurements have been carried out and illustrate the bidirectional recording behavior of this experimental tape, which seems to be very promising for high-density tape recording.",
    keywords = "SMI-TST: From 2006 in EWI-TST, IR-63018, SMI-MAT: MATERIALS, EWI-5603",
    author = "L.T. Nguyen and A. Lisfi and J.C. Lodder",
    note = "Imported from SMI Reference manager",
    year = "2003",
    language = "Undefined",
    volume = "93",
    pages = "7786--7788",
    journal = "Journal of applied physics",
    issn = "0021-8979",
    publisher = "American Institute of Physics",
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    }

    Nguyen, LT, Lisfi, A & Lodder, JC 2003, 'Obliquely sputtered Co/Cr thin film tape for bidirectional recording', Journal of applied physics, vol. 93, no. 10, pp. 7786-7788.

    Obliquely sputtered Co/Cr thin film tape for bidirectional recording. / Nguyen, L.T.; Lisfi, A.; Lodder, J.C.

    In: Journal of applied physics, Vol. 93, No. 10, 2003, p. 7786-7788.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - Obliquely sputtered Co/Cr thin film tape for bidirectional recording

    AU - Nguyen, L.T.

    AU - Lisfi, A.

    AU - Lodder, J.C.

    N1 - Imported from SMI Reference manager

    PY - 2003

    Y1 - 2003

    N2 - We report the growth and properties of a thin film tape, which can be equivalently recorded in both directions. The experimental tape consists of a 20 nm thick Co layer grown on top of a Cr underlayer 120 nm. The two layers were consecutively sputtered at incident angle of 70° at room temperature onto a rotating drum covered with a polymer substrate. In such growth geometry the running direction of drum is perpendicular to the incidence plane of arriving atoms. As a result of this configuration, a medium with a good orientation of the easy axis along the recording direction as well as a high coercivity of 180 kA/m has been prepared. Recording measurements have been carried out and illustrate the bidirectional recording behavior of this experimental tape, which seems to be very promising for high-density tape recording.

    AB - We report the growth and properties of a thin film tape, which can be equivalently recorded in both directions. The experimental tape consists of a 20 nm thick Co layer grown on top of a Cr underlayer 120 nm. The two layers were consecutively sputtered at incident angle of 70° at room temperature onto a rotating drum covered with a polymer substrate. In such growth geometry the running direction of drum is perpendicular to the incidence plane of arriving atoms. As a result of this configuration, a medium with a good orientation of the easy axis along the recording direction as well as a high coercivity of 180 kA/m has been prepared. Recording measurements have been carried out and illustrate the bidirectional recording behavior of this experimental tape, which seems to be very promising for high-density tape recording.

    KW - SMI-TST: From 2006 in EWI-TST

    KW - IR-63018

    KW - SMI-MAT: MATERIALS

    KW - EWI-5603

    M3 - Article

    VL - 93

    SP - 7786

    EP - 7788

    JO - Journal of applied physics

    JF - Journal of applied physics

    SN - 0021-8979

    IS - 10

    ER -