Observation of magnetic domains using a reflection mode scanning near-field optical microscope

C. Durkam, I.V. Shvets, J.C. Lodder

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    Abstract

    It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of plane showed optical features in a track pattern whose appearance was determined by the position of an analyzer in front of the photomultiplier tube. These features were not apparent in the topography, showing this to be a purely magneto-optic effect.
    Original languageEnglish
    Pages (from-to)1323-1325
    Number of pages3
    JournalApplied physics letters
    Volume70
    Issue number10
    DOIs
    Publication statusPublished - 1997

    Keywords

    • SMI-MAT: MATERIALS
    • SMI-TST: From 2006 in EWI-TST

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