Observation of magnetic domains using a reflection mode scanning near-field optical microscope

C. Durkam; I.V. Shvets; J.C. Lodder

doi:10.1063/1.118524

Observation of magnetic domains using a reflection mode scanning near-field optical microscope

C. Durkam
, I.V. Shvets
, J.C. Lodder

Research output: Contribution to journal › Article › Academic › peer-review

50 Citations (Scopus)

83 Downloads (Pure)

Abstract

It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of plane showed optical features in a track pattern whose appearance was determined by the position of an analyzer in front of the photomultiplier tube. These features were not apparent in the topography, showing this to be a purely magneto-optic effect.

Original language	English
Pages (from-to)	1323-1325
Number of pages	3
Journal	Applied physics letters
Volume	70
Issue number	10
DOIs	https://doi.org/10.1063/1.118524
Publication status	Published - 1997

Keywords

SMI-MAT: MATERIALS
SMI-TST: From 2006 in EWI-TST

Access to Document

10.1063/1.118524

Durkam1997observationFinal published version, 260 KB

Cite this

@article{581735bb4751452f96a2d3f90d5df747,

title = "Observation of magnetic domains using a reflection mode scanning near-field optical microscope",

abstract = "It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of plane showed optical features in a track pattern whose appearance was determined by the position of an analyzer in front of the photomultiplier tube. These features were not apparent in the topography, showing this to be a purely magneto-optic effect.",

keywords = "SMI-MAT: MATERIALS, SMI-TST: From 2006 in EWI-TST",

author = "C. Durkam and I.V. Shvets and J.C. Lodder",

year = "1997",

doi = "10.1063/1.118524",

language = "English",

volume = "70",

pages = "1323--1325",

journal = "Applied physics letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "10",

}

TY - JOUR

T1 - Observation of magnetic domains using a reflection mode scanning near-field optical microscope

AU - Durkam, C.

AU - Shvets, I.V.

AU - Lodder, J.C.

PY - 1997

Y1 - 1997

N2 - It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of plane showed optical features in a track pattern whose appearance was determined by the position of an analyzer in front of the photomultiplier tube. These features were not apparent in the topography, showing this to be a purely magneto-optic effect.

AB - It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of plane showed optical features in a track pattern whose appearance was determined by the position of an analyzer in front of the photomultiplier tube. These features were not apparent in the topography, showing this to be a purely magneto-optic effect.

KW - SMI-MAT: MATERIALS

KW - SMI-TST: From 2006 in EWI-TST

U2 - 10.1063/1.118524

DO - 10.1063/1.118524

M3 - Article

SN - 0003-6951

VL - 70

SP - 1323

EP - 1325

JO - Applied physics letters

JF - Applied physics letters

IS - 10

ER -

Observation of magnetic domains using a reflection mode scanning near-field optical microscope

Abstract

Keywords

Access to Document

Fingerprint

Cite this