Observing oxide surfaces at epitaxial growth conditions with atomic force microscopy

J.J. Broekmaat, F.J.G. Roesthuis, A. Brinkman, H. Rogalla, D.H.A. Blank, A.J.H.M. Rijnders

Research output: Contribution to conferencePosterOther research output

Original languageEnglish
Number of pages1
Publication statusPublished - 22 Jan 2008
EventPhysics@FOM Veldhoven 2008 - NH Koningshof Veldhoven, Veldhoven, Netherlands
Duration: 22 Jan 200823 Jan 2008

Conference

ConferencePhysics@FOM Veldhoven 2008
Country/TerritoryNetherlands
CityVeldhoven
Period22/01/0823/01/08

Cite this