Odd-Even Effects in Charge Transport across Self-Assembled Monolayers

Martin M. Thuo, William F. Reus, Christian A. Nijhuis, Jabulani R. Barber, Choongik Kim, Michael D. Schulz, George M. Whitesides*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

162 Citations (Scopus)
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