Off-chip Diagnosis of Aperture Jitter in Full-flash Analog-to-digital Converters

R. Rosing, Hans G. Kerkhoff, R.J.W.T. Tangelder, M. Sachdev

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the ETW98 IEEE European Test Workshop
    Place of PublicationBarcelona, Spain
    Pages72-77
    Number of pages6
    Publication statusPublished - 27 May 1998

    Keywords

    • METIS-112997

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