Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters

R. Rosing, Hans G. Kerkhoff, R.J.W.T. Tangelder, M. Sachdev

    Research output: Contribution to journalArticleAcademicpeer-review

    5 Citations (Scopus)
    Original languageUndefined
    Pages (from-to)67-74
    Number of pages9
    JournalJournal of electronic testing
    Volume1999
    Issue number1/2
    Publication statusPublished - 1999

    Keywords

    • METIS-111676

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