Ohmic Response in BiFeO3              Domain Walls by Submicron‐Scale Four‐Point Probe Resistance Measurements (Adv. Electron. Mater. 7/2025): Graphical Abstract

Jan L. Rieck; Marcel L. Kolster; Romar A. Avila; Mian Li; Guus Rijnders; Gertjan Koster; Thom Palstra; Roeland Huijink; Beatriz Noheda

doi:10.1002/aelm.202570020

Ohmic Response in BiFeO₃ Domain Walls by Submicron‐Scale Four‐Point Probe Resistance Measurements (Adv. Electron. Mater. 7/2025): Graphical Abstract

Jan L. Rieck
, Marcel L. Kolster
, Romar A. Avila
, Mian Li
, Guus Rijnders
, Gertjan Koster
, Thom Palstra
, Roeland Huijink
, Beatriz Noheda

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

In article number 2400794, Beatriz Noheda and co-workers present four-point resistivity measurements of domain walls (DWs) in multiferroic BiFeO3 thin films, revealing ohmic behavior in lateral DW transport. A novel, lithography-free method, using a collinear submicron-scale multi-point probe (MPP), enables the resistivity extraction of a single DW free of contact resistances. This work enhances the understanding of DW conduction and highlights the use of MPPs for nanoelectronics.

Original language	English
Number of pages	1
Journal	Advanced electronic materials
Volume	11
Issue number	7
DOIs	https://doi.org/10.1002/aelm.202570020
Publication status	Published - 1 May 2025

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1 Article

Ohmic Response in BiFeO₃ Domain Walls by Submicron-Scale Four-Point Probe Resistance Measurements
Rieck, J. L., Kolster, M. L., Avila, R. A., Li, M., Rijnders, G., Koster, G., Palstra, T., Huijink, R. & Noheda, B., May 2025, In: Advanced electronic materials. 11, 7, 2400794.
Research output: Contribution to journal › Article › Academic › peer-review

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title = "Ohmic Response in BiFeO3 Domain Walls by Submicron‐Scale Four‐Point Probe Resistance Measurements (Adv. Electron. Mater. 7/2025): Graphical Abstract",

abstract = "In article number 2400794, Beatriz Noheda and co-workers present four-point resistivity measurements of domain walls (DWs) in multiferroic BiFeO3 thin films, revealing ohmic behavior in lateral DW transport. A novel, lithography-free method, using a collinear submicron-scale multi-point probe (MPP), enables the resistivity extraction of a single DW free of contact resistances. This work enhances the understanding of DW conduction and highlights the use of MPPs for nanoelectronics.",

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doi = "10.1002/aelm.202570020",

language = "English",

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Ohmic Response in BiFeO₃ Domain Walls by Submicron‐Scale Four‐Point Probe Resistance Measurements (Adv. Electron. Mater. 7/2025): Graphical Abstract. / Rieck, Jan L.; Kolster, Marcel L.; Avila, Romar A. et al.
In: Advanced electronic materials, Vol. 11, No. 7, 01.05.2025.

Research output: Contribution to journal › Article › Academic › peer-review

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AU - Rieck, Jan L.

AU - Kolster, Marcel L.

AU - Avila, Romar A.

AU - Li, Mian

AU - Rijnders, Guus

AU - Koster, Gertjan

AU - Palstra, Thom

AU - Huijink, Roeland

AU - Noheda, Beatriz

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AB - In article number 2400794, Beatriz Noheda and co-workers present four-point resistivity measurements of domain walls (DWs) in multiferroic BiFeO3 thin films, revealing ohmic behavior in lateral DW transport. A novel, lithography-free method, using a collinear submicron-scale multi-point probe (MPP), enables the resistivity extraction of a single DW free of contact resistances. This work enhances the understanding of DW conduction and highlights the use of MPPs for nanoelectronics.

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DO - 10.1002/aelm.202570020

M3 - Article

SN - 2199-160X

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JO - Advanced electronic materials

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IS - 7

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Ohmic Response in BiFeO3 Domain Walls by Submicron‐Scale Four‐Point Probe Resistance Measurements (Adv. Electron. Mater. 7/2025): Graphical Abstract

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Ohmic Response in BiFeO3 Domain Walls by Submicron-Scale Four-Point Probe Resistance Measurements

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Ohmic Response in BiFeO₃ Domain Walls by Submicron‐Scale Four‐Point Probe Resistance Measurements (Adv. Electron. Mater. 7/2025): Graphical Abstract

Ohmic Response in BiFeO₃ Domain Walls by Submicron-Scale Four-Point Probe Resistance Measurements