Ohmic Response in BiFeO₃ Domain Walls by Submicron‐Scale Four‐Point Probe Resistance Measurements (Adv. Electron. Mater. 7/2025): Graphical Abstract

Jan L. Rieck
, Marcel L. Kolster
, Romar A. Avila
, Mian Li
, Guus Rijnders
, Gertjan Koster
, Thom Palstra
, Roeland Huijink
, Beatriz Noheda

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Ohmic Response in BiFeO₃ Domain Walls by Submicron-Scale Four-Point Probe Resistance Measurements
Rieck, J. L., Kolster, M. L., Avila, R. A., Li, M., Rijnders, G., Koster, G., Palstra, T., Huijink, R. & Noheda, B., May 2025, In: Advanced electronic materials. 11, 7, 2400794.
Research output: Contribution to journal › Article › Academic › peer-review

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