On-Chip Tap Delay Measurements for a Digital Delay Line Used in High-Speed Inter-Chip Data Communications

O. Petre, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the Eleventh Asian Test Symposium
Place of Publication	Guam, USA
Pages	122-127
Number of pages	6
Publication status	Published - 18 Nov 2002

Keywords

@inproceedings{ba07224fde794ae6a22d66a962bfe362,

title = "On-Chip Tap Delay Measurements for a Digital Delay Line Used in High-Speed Inter-Chip Data Communications",

keywords = "METIS-208789",

author = "O. Petre and Kerkhoff, {Hans G.}",

year = "2002",

month = nov,

day = "18",

language = "Undefined",

isbn = "0-7695-1825-7)",

pages = "122--127",

booktitle = "Proceedings of the Eleventh Asian Test Symposium",

}