On Low-frequency noise of polycrystalline Ge xSi-x for Sub-micron CMOS Technologies

X.Y. Chen, J.A. Johansen, Cora Salm, A.D. van Rheenen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings ICCCD-2000
    Place of PublicationKharagpur, India
    Pages187-190
    Publication statusPublished - 14 Dec 2000

    Keywords

    • METIS-113893

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