On the accuracy of EERs in face recognition and the importance of reliable registration

G.M. Beumer, A.M. Bazen, Raymond N.J. Veldhuis

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publication5th IEEE Benelux Signal Processing Symposium (SPS-2005)
    Place of Publicationsecretariaat in Delft
    PublisherIEEE
    Pages85-88
    Number of pages4
    ISBN (Print)not assigned
    Publication statusPublished - Apr 2005
    Event1st Annual IEEE BENELUX/DSP Valley Signal Processing Symposium, SPS-DARTS 2005 - Antwerp, Belgium
    Duration: 19 Apr 200520 Apr 2005
    Conference number: 1

    Conference

    Conference1st Annual IEEE BENELUX/DSP Valley Signal Processing Symposium, SPS-DARTS 2005
    Abbreviated titleSPS-DARTS
    Country/TerritoryBelgium
    CityAntwerp
    Period19/04/0520/04/05

    Keywords

    • EWI-690
    • METIS-224411
    • SCS-Safety

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