On The Defect Model and the Dielectric Properties of Lanthana Substituted Lead Titanate Ceramics

K. Keizer, J. Bouwma, A.J. Burggraaf

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Abstract

The defect concentrations in lanthana substituted lead titanate and the effect of sintering temperature on the dielectric constant (e‘) around the Curie point have been studied. On the basis of our x-ray diffraction results the presence of Ti-site vacancies seems unlikely. This conclusion is in contradiction with Hennings’ defect model. A decrease of the sintering temperature leads to a decrease of the maximum value of e and to a broadening of the peak in the e‘ vs. temperature curve at the Curie point. Probably, grain size as well as compositional fluctuations contribute to the observed variations.

Original languageEnglish
Pages (from-to)341-343
Number of pages3
JournalFerroelectrics
Volume7
Issue number1
DOIs
Publication statusPublished - 1974

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Lanthanum
lanthanum
Dielectric properties
dielectric properties
Lead
ceramics
Defects
defects
sintering
Sintering
Temperature
Vacancies
temperature
x ray diffraction
Permittivity
Diffraction
grain size
permittivity
X rays
curves

Cite this

Keizer, K. ; Bouwma, J. ; Burggraaf, A.J. / On The Defect Model and the Dielectric Properties of Lanthana Substituted Lead Titanate Ceramics. In: Ferroelectrics. 1974 ; Vol. 7, No. 1. pp. 341-343.
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On The Defect Model and the Dielectric Properties of Lanthana Substituted Lead Titanate Ceramics. / Keizer, K.; Bouwma, J.; Burggraaf, A.J.

In: Ferroelectrics, Vol. 7, No. 1, 1974, p. 341-343.

Research output: Contribution to journalArticleAcademicpeer-review

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