On the maximization of the sustained switching activity in a processor

R. Cantoro, M. Sonza Reorda, A. Rohani, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    4 Citations (Scopus)
    8 Downloads (Pure)

    Abstract

    Recently, several application areas in the test domain (e.g., burn-in and aging monitoring) started to require suitable input stimuli, able to maximize the switching activity of a certain module for a certain period of time. If the module is part of a processor, this turns into identifying a suitable sequence of instructions, able to maximize the switching activity. This paper proposes a method to attack this problem, and reports some experimental results gathered on a MIPS-like pipelined processor.
    Original languageUndefined
    Title of host publicationIEEE 21st International On-Line Testing Symposium, IOLST 2015
    Place of PublicationUSA
    PublisherIEEE
    Pages34-35
    Number of pages2
    ISBN (Print)978-1-4673-7905-2
    DOIs
    Publication statusPublished - Jul 2015
    Event21st IEEE International On-Line Testing Symposium 2015 - Halkidiki, Greece, Halkidiki, Greece
    Duration: 6 Jul 20158 Jul 2015
    http://tima.univ-grenoble-alpes.fr/conferences/iolts/iolts15/

    Publication series

    Name
    PublisherIEEE Computer Society
    ISSN (Print)1942-9398

    Conference

    Conference21st IEEE International On-Line Testing Symposium 2015
    Abbreviated titleIOLTS 2015
    Country/TerritoryGreece
    CityHalkidiki
    Period6/07/158/07/15
    Internet address

    Keywords

    • CAES-TDT: Testable Design and Test
    • EC Grant Agreement nr.: FP7/619871
    • IR-101089
    • METIS-318483
    • EWI-27121

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