On the optimization and optimal selection of tests for analog/mixed-signal macros

V. Kaal, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 2nd IEEE International Mixed Signal Testing Workshop (IMSTW'96)
    Place of PublicationQuebec City, Canada
    Publication statusPublished - 15 May 1996


    • METIS-112953

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