Abstract
Photoexcitation and charge carrier thermalization inside semiconductor photocatalysts are two important steps in solar fuel production. Here, photoexcitation and charge carrier thermalization in a silicon wafer are for the first time probed by a novel, yet simple and user-friendly Attenuated Total Reflectance Infrared spectroscopy (ATR-IR) system
Original language | English |
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Pages (from-to) | 10882-10885 |
Number of pages | 4 |
Journal | Physical chemistry chemical physics |
Volume | 14 |
Issue number | 31 |
DOIs | |
Publication status | Published - 22 Jun 2012 |
Keywords
- METIS-287790
- IR-81306