On the vectorial calibration of a VSM for measuring thin films

T. Bolhuis, L. Abelmann, J.C. Lodder

    Research output: Working paperOther research output

    Original languageEnglish
    Place of PublicationEnschede
    PublisherUniversity of Twente
    Publication statusPublished - 23 Jun 1998

    Keywords

    • METIS-114532

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