On the vectorial calibration of a VSM for measuring thin films

T. Bolhuis, L. Abelmann, J.C. Lodder

    Research output: Working paper

    Original languageEnglish
    Place of PublicationEnschede
    PublisherUniversity of Twente
    Publication statusPublished - 23 Jun 1998

    Keywords

    • METIS-114532

    Cite this

    Bolhuis, T., Abelmann, L., & Lodder, J. C. (1998). On the vectorial calibration of a VSM for measuring thin films. Enschede: University of Twente.