One-shot 3d surface reconstruction from instantaneous frequencies: solutions to ambiguity problems

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    Abstract

    Phase-measuring profilometry is a well known technique for 3D surface reconstruction based on a sinusoidal pattern that is projected on a scene. If the surface is partly occluded by, for instance, other objects, then the depth shows abrupt transitions at the edges of these occlusions. This causes ambiguities in the phase and, consequently, also in the reconstruction. This paper introduces a reconstruction method that is based on the instantaneous frequency instead of phase. Using these instantaneous frequencies we present a method to recover from ambiguities caused by occlusion. The recovery works under the condition that some surface patches can be found that are planar. This ability is demonstrated in a simple example.
    Original languageEnglish
    Title of host publicationInternational Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2009)
    PublisherINSTICC PRESS
    Pages423-428
    Number of pages6
    ISBN (Print)978-989-8111-74-6
    DOIs
    Publication statusPublished - Feb 2009
    EventInternational Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2009 - Lisboa, Portugal
    Duration: 5 Feb 20098 Feb 2009

    Conference

    ConferenceInternational Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2009
    Abbreviated titleVISIGRAPP
    CountryPortugal
    CityLisboa
    Period5/02/098/02/09

    Keywords

    • Ambiguity
    • 3D-Surface reconstruction
    • SCS-Safety
    • Occlusion
    • Phase-measuring profilometry
    • One-shot structured lighting

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