Abstract
Phase-measuring profilometry is a well known technique for 3D surface reconstruction based on a sinusoidal pattern that is projected on a scene. If the surface is partly occluded by, for instance, other objects, then the depth shows abrupt transitions at the edges of these occlusions. This causes ambiguities in the phase and, consequently, also in the reconstruction.
This paper introduces a reconstruction method that is based on the instantaneous frequency instead of phase. Using these instantaneous frequencies we present a method to recover from ambiguities caused by occlusion. The recovery works under the condition that some surface patches can be found that are planar. This ability is demonstrated in a simple example.
Original language | English |
---|---|
Title of host publication | International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2009) |
Publisher | INSTICC PRESS |
Pages | 423-428 |
Number of pages | 6 |
ISBN (Print) | 978-989-8111-74-6 |
DOIs | |
Publication status | Published - Feb 2009 |
Event | International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2009 - Lisboa, Portugal Duration: 5 Feb 2009 → 8 Feb 2009 |
Conference
Conference | International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2009 |
---|---|
Abbreviated title | VISIGRAPP |
Country/Territory | Portugal |
City | Lisboa |
Period | 5/02/09 → 8/02/09 |
Keywords
- Ambiguity
- 3D-Surface reconstruction
- SCS-Safety
- Occlusion
- Phase-measuring profilometry
- One-shot structured lighting