Abstract

In parametric IC testing, outlier detection is applied to filter out potential unreliable devices. Most outlier detection methods are used in an offline setting and hence are not applicable to Final Test, where immediate pass/fail decisions are required. Therefore, we developed a new bivariate online outlier detection method that is applicable to Final Test without making assumptions about a specific form of relations between two test parameters. An acceptance region is constructed using kernel density estimation. We use a grid discretization in order to enable a fast outlier decision. After each accepted device the grid is updated, hence the method is able to adapt to shifting measurements.
Original languageUndefined
Title of host publicationIEEE Defect and Adaptive Test Analysis Workshop
Place of PublicationUSA
PublisherIEEE Computer Society
Pages-
Number of pages6
ISBN (Print)not assigned
StatePublished - 22 Sep 2011

Publication series

Name
PublisherIEEE Computer Society

Fingerprint

Testing

Keywords

  • EWI-22580
  • Kernel Density
  • METIS-289798
  • IR-83435
  • Adaptive
  • Outlier Detection

Cite this

Bossers, H. C. M., Hurink, J. L., & Smit, G. J. M. (2011). Online Bivariate Outlier Detection in Final Test Using Kernel Density Estimation. In IEEE Defect and Adaptive Test Analysis Workshop (pp. -). USA: IEEE Computer Society.

Bossers, H.C.M.; Hurink, Johann L.; Smit, Gerardus Johannes Maria / Online Bivariate Outlier Detection in Final Test Using Kernel Density Estimation.

IEEE Defect and Adaptive Test Analysis Workshop. USA : IEEE Computer Society, 2011. p. -.

Research output: Scientific - peer-reviewConference contribution

@inbook{8998cb02e2b34264b5353b070157eb8b,
title = "Online Bivariate Outlier Detection in Final Test Using Kernel Density Estimation",
abstract = "In parametric IC testing, outlier detection is applied to filter out potential unreliable devices. Most outlier detection methods are used in an offline setting and hence are not applicable to Final Test, where immediate pass/fail decisions are required. Therefore, we developed a new bivariate online outlier detection method that is applicable to Final Test without making assumptions about a specific form of relations between two test parameters. An acceptance region is constructed using kernel density estimation. We use a grid discretization in order to enable a fast outlier decision. After each accepted device the grid is updated, hence the method is able to adapt to shifting measurements.",
keywords = "EWI-22580, Kernel Density, METIS-289798, IR-83435, Adaptive, Outlier Detection",
author = "H.C.M. Bossers and Hurink, {Johann L.} and Smit, {Gerardus Johannes Maria}",
year = "2011",
month = "9",
isbn = "not assigned",
publisher = "IEEE Computer Society",
pages = "--",
booktitle = "IEEE Defect and Adaptive Test Analysis Workshop",
address = "United States",

}

Bossers, HCM, Hurink, JL & Smit, GJM 2011, Online Bivariate Outlier Detection in Final Test Using Kernel Density Estimation. in IEEE Defect and Adaptive Test Analysis Workshop. IEEE Computer Society, USA, pp. -.

Online Bivariate Outlier Detection in Final Test Using Kernel Density Estimation. / Bossers, H.C.M.; Hurink, Johann L.; Smit, Gerardus Johannes Maria.

IEEE Defect and Adaptive Test Analysis Workshop. USA : IEEE Computer Society, 2011. p. -.

Research output: Scientific - peer-reviewConference contribution

TY - CHAP

T1 - Online Bivariate Outlier Detection in Final Test Using Kernel Density Estimation

AU - Bossers,H.C.M.

AU - Hurink,Johann L.

AU - Smit,Gerardus Johannes Maria

PY - 2011/9/22

Y1 - 2011/9/22

N2 - In parametric IC testing, outlier detection is applied to filter out potential unreliable devices. Most outlier detection methods are used in an offline setting and hence are not applicable to Final Test, where immediate pass/fail decisions are required. Therefore, we developed a new bivariate online outlier detection method that is applicable to Final Test without making assumptions about a specific form of relations between two test parameters. An acceptance region is constructed using kernel density estimation. We use a grid discretization in order to enable a fast outlier decision. After each accepted device the grid is updated, hence the method is able to adapt to shifting measurements.

AB - In parametric IC testing, outlier detection is applied to filter out potential unreliable devices. Most outlier detection methods are used in an offline setting and hence are not applicable to Final Test, where immediate pass/fail decisions are required. Therefore, we developed a new bivariate online outlier detection method that is applicable to Final Test without making assumptions about a specific form of relations between two test parameters. An acceptance region is constructed using kernel density estimation. We use a grid discretization in order to enable a fast outlier decision. After each accepted device the grid is updated, hence the method is able to adapt to shifting measurements.

KW - EWI-22580

KW - Kernel Density

KW - METIS-289798

KW - IR-83435

KW - Adaptive

KW - Outlier Detection

M3 - Conference contribution

SN - not assigned

SP - -

BT - IEEE Defect and Adaptive Test Analysis Workshop

PB - IEEE Computer Society

ER -

Bossers HCM, Hurink JL, Smit GJM. Online Bivariate Outlier Detection in Final Test Using Kernel Density Estimation. In IEEE Defect and Adaptive Test Analysis Workshop. USA: IEEE Computer Society. 2011. p. -.