Opcode vector: An efficient scheme to detect soft errors in instructions

J. Martinez, M. Atamaner, P. Reviriego, O. Ergin, M. Ottavi

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	92-97
Journal	Microelectronics reliability
Volume	86
DOIs	https://doi.org/10.1016/j.microrel.2018.03.017
Publication status	Published - 2018
Externally published	Yes

Access to Document

@article{36aaa734bee34379bd3f51289653bb9a,

title = "Opcode vector: An efficient scheme to detect soft errors in instructions",

author = "J. Martinez and M. Atamaner and P. Reviriego and O. Ergin and M. Ottavi",

year = "2018",

doi = "10.1016/j.microrel.2018.03.017",

language = "English",

volume = "86",

pages = "92--97",

journal = "Microelectronics reliability",

issn = "0026-2714",

publisher = "Elsevier",

}

TY - JOUR

T1 - Opcode vector: An efficient scheme to detect soft errors in instructions

AU - Martinez, J.

AU - Atamaner, M.

AU - Reviriego, P.

AU - Ergin, O.

AU - Ottavi, M.

PY - 2018

Y1 - 2018

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-85044341446&partnerID=MN8TOARS

U2 - 10.1016/j.microrel.2018.03.017

DO - 10.1016/j.microrel.2018.03.017

M3 - Article

SN - 0026-2714

VL - 86

SP - 92

EP - 97

JO - Microelectronics reliability

JF - Microelectronics reliability

ER -