@inproceedings{5c7a0cc29d4346c599c0027a7a3105a8,
title = "Operation of a scanning near field optical microscope in reflection in combination with a scanning force microscope",
abstract = "Images obtained with a scanning near field optical microscope (SNOM) operating in reflection are presented. We have obtained the first results with a SiN tip as optical probe. The instrument is simultaneously operated as a scanning force microscope (SFM). Moreover, the instrument incorporates an inverted light microscope (LM) for preselection of a scan area. The SiN probe is operated in the contact regime causing a highly improved lateral resolution in the optical image compared to an alternative set-up using a fiber probe, which is also presented. The combined microscope is operated either in open loop or as a force regulated SNOM. Near field optical images can be directly compared with the topography displayed in the simultaneously recorded SFM image.",
author = "{van Hulst}, N.F. and M.H.P. Moers and O.F.J. Noordman and T. Faulkner and F.B. Segerink and {van der Werf}, K.O. and {de Grooth}, B.G. and B. B{\"o}lger",
year = "1992",
month = jan,
day = "20",
doi = "10.1117/12.58190",
language = "English",
isbn = "0-8194-0785-2",
series = "Proceedings of SPIE",
publisher = "SPIE",
pages = "36--43",
editor = "Srinivas Manne",
booktitle = "Scanning Probe Microscopies",
address = "United States",
note = "SPIE OE/LASE 1992, OE/LASE ; Conference date: 19-01-1992 Through 24-01-1992",
}