Operation of a scanning near field optical microscope in reflection in combination with a scanning force microscope

N.F. van Hulst, M.H.P. Moers, O.F.J. Noordman, T. Faulkner, F.B. Segerink, K.O. van der Werf, B.G. de Grooth, B. Bölger

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Abstract

Images obtained with a scanning near field optical microscope (SNOM) operating in reflection are presented. We have obtained the first results with a SiN tip as optical probe. The instrument is simultaneously operated as a scanning force microscope (SFM). Moreover, the instrument incorporates an inverted light microscope (LM) for preselection of a scan area. The SiN probe is operated in the contact regime causing a highly improved lateral resolution in the optical image compared to an alternative set-up using a fiber probe, which is also presented. The combined microscope is operated either in open loop or as a force regulated SNOM. Near field optical images can be directly compared with the topography displayed in the simultaneously recorded SFM image.
Original languageEnglish
Title of host publicationScanning Probe Microscopies
EditorsSrinivas Manne
Place of PublicationLos Angeles, CA
PublisherSPIE
Pages36-43
Number of pages7
ISBN (Print)0-8194-0785-2
DOIs
Publication statusPublished - 20 Jan 1992
EventSPIE OE/LASE 1992 - Los Angeles, United States
Duration: 19 Jan 199224 Jan 1992

Publication series

NameProceedings of SPIE
PublisherSPIE
Volume1639
ISSN (Print)0277-786X

Conference

ConferenceSPIE OE/LASE 1992
Abbreviated titleOE/LASE
CountryUnited States
CityLos Angeles
Period19/01/9224/01/92

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van Hulst, N. F., Moers, M. H. P., Noordman, O. F. J., Faulkner, T., Segerink, F. B., van der Werf, K. O., ... Bölger, B. (1992). Operation of a scanning near field optical microscope in reflection in combination with a scanning force microscope. In S. Manne (Ed.), Scanning Probe Microscopies (pp. 36-43). (Proceedings of SPIE; Vol. 1639). Los Angeles, CA: SPIE. https://doi.org/10.1117/12.58190