Optical characterization and selective addressing of the resonant modes of a micropillar cavity with a white light beam

Georgios Ctistis, A. Hartsuiker, Edwin van der Pol, Julien Claudon, Willem L. Vos, Jean-Michel Gérard

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Abstract

We have performed white light reflectivity measurements on GaAs/AlAs micropillar cavities with diameters ranging from 1 μm up to 20 μm. We are able to resolve the spatial field distribution of each cavity mode in real space by scanning a small-sized beam across the top facet of each micropillar. We spectrally resolve distinct transverse-optical cavity modes in reflectivity. Using this procedure we can selectively address a single mode in the multimode micropillar cavity. Calculations for the coupling efficiency of a small-diameter beam to each mode are in very good agreement with our reflectivity measurements
Original languageEnglish
Pages (from-to)195330-1-7
Number of pages7
JournalPhysical review B: Condensed matter and materials physics
Volume82
Issue number19
DOIs
Publication statusPublished - 2010

Keywords

  • IR-78583
  • METIS-270340

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