Abstract
We have performed white light reflectivity measurements on GaAs/AlAs micropillar cavities with diameters ranging from 1 μm up to 20 μm. We are able to resolve the spatial field distribution of each cavity mode in real space by scanning a small-sized beam across the top facet of each micropillar. We spectrally resolve distinct transverse-optical cavity modes in reflectivity. Using this procedure we can selectively address a single mode in the multimode micropillar cavity. Calculations for the coupling efficiency of a small-diameter beam to each mode are in very good agreement with our reflectivity measurements
Original language | English |
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Pages (from-to) | 195330-1-7 |
Number of pages | 7 |
Journal | Physical review B: Condensed matter and materials physics |
Volume | 82 |
Issue number | 19 |
DOIs | |
Publication status | Published - 2010 |
Keywords
- IR-78583
- METIS-270340