Optical characterization of nanocrystal self-assembly by spectroscopic ellipsometry

Research output: Contribution to conferencePoster

Original languageUndefined
Pages-
Publication statusPublished - 18 Aug 2002

Keywords

  • METIS-208226

Cite this

@conference{2b77f698907b43d0ae19e1cbb08834fb,
title = "Optical characterization of nanocrystal self-assembly by spectroscopic ellipsometry",
keywords = "METIS-208226",
author = "Kooij, {Ernst S.} and E.A.M. Brouwer and Herbert Wormeester and Bene Poelsema",
year = "2002",
month = "8",
day = "18",
language = "Undefined",
pages = "--",

}

TY - CONF

T1 - Optical characterization of nanocrystal self-assembly by spectroscopic ellipsometry

AU - Kooij, Ernst S.

AU - Brouwer, E.A.M.

AU - Wormeester, Herbert

AU - Poelsema, Bene

PY - 2002/8/18

Y1 - 2002/8/18

KW - METIS-208226

M3 - Poster

SP - -

ER -