Optical properties of poly(ferrocenylsilane) multilayer thin films

Research output: Contribution to journalArticleAcademicpeer-review

6 Citations (Scopus)

Abstract

Spectroscopic ellipsometry has been used to investigate the optical properties of poly(ferrocenylsilane) polyion multilayer thin films in the visible and near-infrared range of the spectrum. The thin films were deposited using the layer-by-layer assembly process. Films with thicknesses of up to 55 nm were fabricated stepwise from polyelectrolyte solutions with a controlled ionic strength. These films allow an accurate characterization of the optical properties of poly(ferrocenylsilane) polyion layers. We show that the complex refractive index can be described by a simple Cauchy model. Refractive index values vary over the spectral range from 1.53 (near-infrared) to 1.8 (ultraviolet).
Original languageEnglish
Pages (from-to)14177-14181
Number of pages5
JournalLangmuir
Volume26
Issue number17
DOIs
Publication statusPublished - 2010

Keywords

  • IR-75145
  • METIS-269099

Fingerprint Dive into the research topics of 'Optical properties of poly(ferrocenylsilane) multilayer thin films'. Together they form a unique fingerprint.

  • Cite this