Abstract
Spectroscopic ellipsometry has been used to investigate the optical properties of poly(ferrocenylsilane) polyion multilayer thin films in the visible and near-infrared range of the spectrum. The thin films were deposited using the layer-by-layer assembly process. Films with thicknesses of up to 55 nm were fabricated stepwise from polyelectrolyte solutions with a controlled ionic strength. These films allow an accurate characterization of the optical properties of poly(ferrocenylsilane) polyion layers. We show that the complex refractive index can be described by a simple Cauchy model. Refractive index values vary over the spectral range from 1.53 (near-infrared) to 1.8 (ultraviolet).
Original language | English |
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Pages (from-to) | 14177-14181 |
Number of pages | 5 |
Journal | Langmuir |
Volume | 26 |
Issue number | 17 |
DOIs | |
Publication status | Published - 2010 |
Keywords
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