Optimisation of lateral resolution in magnetic force microscopy

S. Porthun, Leon Abelmann, S.J.L. Vellekoop, J.C. Lodder, H.J. Hug

    Research output: Contribution to journalArticleAcademicpeer-review

    25 Citations (Scopus)

    Abstract

    Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument’s configuration. The model of the minimum detectable wavelength is then used to optimize the tip-sample configuration geometrically as well as magnetically.
    Original languageEnglish
    Pages (from-to)S1185-S1189
    Number of pages5
    JournalApplied physics A: solids and surfaces
    Volume66
    Issue numberSuppl. 1
    DOIs
    Publication statusPublished - 1998

    Keywords

    • IR-63029
    • METIS-111879
    • EWI-5620
    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • SMI-TST: From 2006 in EWI-TST

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