Optimisation of lateral resolution in magnetic force microscopy

S. Porthun; L. Abelmann; S.J.L. Vellekoop; J.C. Lodder; H.J. Hug

doi:10.1007/s003390051323

Optimisation of lateral resolution in magnetic force microscopy

S. Porthun, L. Abelmann, S.J.L. Vellekoop, J.C. Lodder, H.J. Hug

Research output: Contribution to journal › Article › Academic › peer-review

26 Citations (Scopus)

4 Downloads (Pure)

Abstract

Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument’s configuration. The model of the minimum detectable wavelength is then used to optimize the tip-sample configuration geometrically as well as magnetically.

Original language	English
Pages (from-to)	S1185-S1189
Number of pages	5
Journal	Applied physics A: solids and surfaces
Volume	66
Issue number	Suppl. 1
DOIs	https://doi.org/10.1007/s003390051323
Publication status	Published - 1998

Keywords

IR-63029
METIS-111879
EWI-5620
SMI-EXP: EXPERIMENTAL TECHNIQUES
SMI-TST: From 2006 in EWI-TST

Access to Document

10.1007/s003390051323

Cite this

@article{5ad8fa7fb72843a5a2f193dceec76f15,

title = "Optimisation of lateral resolution in magnetic force microscopy",

abstract = "Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument{\textquoteright}s configuration. The model of the minimum detectable wavelength is then used to optimize the tip-sample configuration geometrically as well as magnetically.",

keywords = "IR-63029, METIS-111879, EWI-5620, SMI-EXP: EXPERIMENTAL TECHNIQUES, SMI-TST: From 2006 in EWI-TST",

author = "S. Porthun and L. Abelmann and S.J.L. Vellekoop and J.C. Lodder and H.J. Hug",

note = "Imported from SMI Reference manager",

year = "1998",

doi = "10.1007/s003390051323",

language = "English",

volume = "66",

pages = "S1185--S1189",

journal = "Applied physics A: solids and surfaces",

issn = "0721-7250",

publisher = "Springer",

number = "Suppl. 1",

}

TY - JOUR

T1 - Optimisation of lateral resolution in magnetic force microscopy

AU - Porthun, S.

AU - Abelmann, L.

AU - Vellekoop, S.J.L.

AU - Lodder, J.C.

AU - Hug, H.J.

N1 - Imported from SMI Reference manager

PY - 1998

Y1 - 1998

N2 - Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument’s configuration. The model of the minimum detectable wavelength is then used to optimize the tip-sample configuration geometrically as well as magnetically.

AB - Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument’s configuration. The model of the minimum detectable wavelength is then used to optimize the tip-sample configuration geometrically as well as magnetically.

KW - IR-63029

KW - METIS-111879

KW - EWI-5620

KW - SMI-EXP: EXPERIMENTAL TECHNIQUES

KW - SMI-TST: From 2006 in EWI-TST

U2 - 10.1007/s003390051323

DO - 10.1007/s003390051323

M3 - Article

SN - 0721-7250

VL - 66

SP - S1185-S1189

JO - Applied physics A: solids and surfaces

JF - Applied physics A: solids and surfaces

IS - Suppl. 1

ER -

Optimisation of lateral resolution in magnetic force microscopy

Abstract

Keywords

Access to Document

Fingerprint

Cite this