Starting from the tip transfer function (TTF), as derived in , a minimum detectable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument’s configuration. The model of the minimum detectable wavelength is then used to optimize the tip-sample configuration geometrically as well as magnetically.
- SMI-EXP: EXPERIMENTAL TECHNIQUES
- SMI-TST: From 2006 in EWI-TST