Optimization models for test assembly to match observed-score distributions

Wim J. van der Linden, Richard M. Luecht

    Research output: Contribution to conferencePaperAcademic

    Original languageEnglish
    Publication statusPublished - 19 Apr 1995
    EventAnnual Meeting of the National Council on Measurement in Education, NCME 1995 - San Francisco, United States
    Duration: 19 Apr 199521 Apr 1995

    Conference

    ConferenceAnnual Meeting of the National Council on Measurement in Education, NCME 1995
    Abbreviated titleNCME
    Country/TerritoryUnited States
    CitySan Francisco
    Period19/04/9521/04/95

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