Optimization models for test assembly to match observed-score distributions

Research output: Contribution to conference › Paper › Academic

Original language	English
Publication status	Published - 19 Apr 1995
Event	Annual Meeting of the National Council on Measurement in Education, NCME 1995 - San Francisco, United States Duration: 19 Apr 1995 → 21 Apr 1995

Conference	Annual Meeting of the National Council on Measurement in Education, NCME 1995
Abbreviated title	NCME
Country/Territory	United States
City	San Francisco
Period	19/04/95 → 21/04/95

Cite this

@conference{d243a62b66dd4afc9c2826172f7059d7,

title = "Optimization models for test assembly to match observed-score distributions",

author = "{van der Linden}, {Wim J.} and Luecht, {Richard M.}",

year = "1995",

month = apr,

day = "19",

language = "English",

note = "Annual Meeting of the National Council on Measurement in Education, NCME 1995, NCME ; Conference date: 19-04-1995 Through 21-04-1995",

}