Optimization models for test assembly to match observed-score distributions

Research output: Contribution to conference › Paper

Original language	English
Pages	-
Publication status	Published - 17 Jun 1993
Event	58th Annual Meeting of the Psychometric Society 1993 - University of California, Berkeley, United States Duration: 17 Jun 1993 → 20 Jun 1993 Conference number: 58

Conference	58th Annual Meeting of the Psychometric Society 1993
Country/Territory	United States
City	Berkeley
Period	17/06/93 → 20/06/93

Keywords

@conference{d0585b2ce67e4e80af815bca148fe3e8,

title = "Optimization models for test assembly to match observed-score distributions",

keywords = "METIS-140086",

author = "\{van der Linden\}, \{Willem J.\} and R.M. Luecht",

year = "1993",

month = jun,

day = "17",

language = "English",

pages = "--",

note = "58th Annual Meeting of the Psychometric Society 1993 ; Conference date: 17-06-1993 Through 20-06-1993",

}