Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion

O.H. Willemsen, M.M.E. Snel, S.J.T. van Noort, Kees van der Werf, B.G. de Grooth, Carl Figdor, Jan Greve

    Research output: Contribution to journalArticleAcademicpeer-review

    9 Citations (Scopus)

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