TY - JOUR
T1 - Optimized fabrication of high-quality La0.67Sr0.33MnO3 thin films considering all essential characteristics
AU - Boschker, J.A.
AU - Huijben, Mark
AU - Vailionis, A.
AU - Verbeeck, J.
AU - van Aert, S.
AU - Luysberg, M.
AU - Bals, S.
AU - van Tendeloo, G.
AU - Houwman, Evert Pieter
AU - Koster, Gertjan
AU - Blank, David H.A.
AU - Rijnders, Augustinus J.H.M.
PY - 2011
Y1 - 2011
N2 - In this paper, an overview of the fabrication and properties of high-quality La0.67Sr0.33MnO3 (LSMO) thin films is given. A high-quality LSMO film combines a smooth surface morphology with a large magnetization and a small residual resistivity, while avoiding precipitates and surface segregation. In the literature, typically only a few of these issues are adressed. We therefore present a thorough characterization of our films, which were grown by pulsed laser deposition. The films were characterized with reflection high energy electron diffraction, atomic force microscopy, x-ray diffraction, magnetization and transport measurements, x-ray photoelectron spectroscopy and scanning transmission electron microscopy. The films have a saturation magnetization of 4.0 µB/Mn, a Curie temperature of 350 K and a residual resistivity of 60 µΩ cm. These results indicate that high-quality films, combining both large magnetization and small residual resistivity, were realized. A comparison between different samples presented in the literature shows that focussing on a single property is insufficient for the optimization of the deposition process. For high-quality films, all properties have to be adressed. For LSMO devices, the thin-film quality is crucial for the device performance. Therefore, this research is important for the application of LSMO in devices.
AB - In this paper, an overview of the fabrication and properties of high-quality La0.67Sr0.33MnO3 (LSMO) thin films is given. A high-quality LSMO film combines a smooth surface morphology with a large magnetization and a small residual resistivity, while avoiding precipitates and surface segregation. In the literature, typically only a few of these issues are adressed. We therefore present a thorough characterization of our films, which were grown by pulsed laser deposition. The films were characterized with reflection high energy electron diffraction, atomic force microscopy, x-ray diffraction, magnetization and transport measurements, x-ray photoelectron spectroscopy and scanning transmission electron microscopy. The films have a saturation magnetization of 4.0 µB/Mn, a Curie temperature of 350 K and a residual resistivity of 60 µΩ cm. These results indicate that high-quality films, combining both large magnetization and small residual resistivity, were realized. A comparison between different samples presented in the literature shows that focussing on a single property is insufficient for the optimization of the deposition process. For high-quality films, all properties have to be adressed. For LSMO devices, the thin-film quality is crucial for the device performance. Therefore, this research is important for the application of LSMO in devices.
KW - IR-104428
KW - METIS-280033
U2 - 10.1088/0022-3727/44/20/205001
DO - 10.1088/0022-3727/44/20/205001
M3 - Article
SN - 0022-3727
VL - 44
SP - 205001-
JO - Journal of physics D: applied physics
JF - Journal of physics D: applied physics
IS - 20
ER -