Optimized fabrication of high-quality La0.67Sr0.33MnO3 thin films considering all essential characteristics

J.A. Boschker, Mark Huijben, A. Vailionis, J. Verbeeck, S. van Aert, M. Luysberg, S. Bals, G. van Tendeloo, Evert Pieter Houwman, Gertjan Koster, David H.A. Blank, Augustinus J.H.M. Rijnders

Research output: Contribution to journalArticleAcademicpeer-review

90 Citations (Scopus)

Abstract

In this paper, an overview of the fabrication and properties of high-quality La0.67Sr0.33MnO3 (LSMO) thin films is given. A high-quality LSMO film combines a smooth surface morphology with a large magnetization and a small residual resistivity, while avoiding precipitates and surface segregation. In the literature, typically only a few of these issues are adressed. We therefore present a thorough characterization of our films, which were grown by pulsed laser deposition. The films were characterized with reflection high energy electron diffraction, atomic force microscopy, x-ray diffraction, magnetization and transport measurements, x-ray photoelectron spectroscopy and scanning transmission electron microscopy. The films have a saturation magnetization of 4.0 µB/Mn, a Curie temperature of 350 K and a residual resistivity of 60 µΩ cm. These results indicate that high-quality films, combining both large magnetization and small residual resistivity, were realized. A comparison between different samples presented in the literature shows that focussing on a single property is insufficient for the optimization of the deposition process. For high-quality films, all properties have to be adressed. For LSMO devices, the thin-film quality is crucial for the device performance. Therefore, this research is important for the application of LSMO in devices.
Original languageUndefined
Pages (from-to)205001-
Number of pages9
JournalJournal of physics D: applied physics
Volume44
Issue number20
DOIs
Publication statusPublished - 2011

Keywords

  • IR-104428
  • METIS-280033

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