Abstract
In this paper, an optimum stage ratio (tapering factor) for a tapered CMOS inverter chain is derived to minimize the product of power dissipation and jitter variance due to device mismatch. Analysis shows that this optimum stage ratio (2.4) is lower than that of minimum delay (3.6) and minimum power-delay (6.35) product. This analysis is verified by simulation results using standard 180 nm as well as 90 nm CMOS technology. Knowledge of the optimum stage ratio helps to design low power low mismatch jitter buffers for multi phase clock generation circuits that can drive large load capacitances.
Original language | English |
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Title of host publication | 23th International Conference on VLSI Design, VLSID 2010 |
Place of Publication | Piscataway |
Publisher | IEEE |
Pages | 152-157 |
Number of pages | 6 |
ISBN (Print) | 978-1-4244-5541-6 |
DOIs | |
Publication status | Published - 6 Jan 2010 |
Event | 23th International Conference on VLSI Design, VLSID 2010 - Bangalore, India Duration: 3 Jan 2010 → 7 Jan 2010 Conference number: 23 |
Conference
Conference | 23th International Conference on VLSI Design, VLSID 2010 |
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Abbreviated title | VLSID |
Country/Territory | India |
City | Bangalore |
Period | 3/01/10 → 7/01/10 |
Keywords
- METIS-275611
- CMOS inverter
- IR-75789
- multiphase clock
- EWI-18150
- stage ratio
- mismatch jitter
- Tapering factor
- figure of meri
- Low power