Optimized Stage Ratio of Tapered CMOS Inverters for Minimum Power and Mismatch Jitter Product

R. Dutta, T.K. Bhattacharyya, X. Gao, Eric A.M. Klumperink

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    6 Citations (Scopus)
    382 Downloads (Pure)

    Abstract

    In this paper, an optimum stage ratio (tapering factor) for a tapered CMOS inverter chain is derived to minimize the product of power dissipation and jitter variance due to device mismatch. Analysis shows that this optimum stage ratio (2.4) is lower than that of minimum delay (3.6) and minimum power-delay (6.35) product. This analysis is verified by simulation results using standard 180 nm as well as 90 nm CMOS technology. Knowledge of the optimum stage ratio helps to design low power low mismatch jitter buffers for multi phase clock generation circuits that can drive large load capacitances.
    Original languageEnglish
    Title of host publication23th International Conference on VLSI Design, VLSID 2010
    Place of PublicationPiscataway
    PublisherIEEE
    Pages152-157
    Number of pages6
    ISBN (Print)978-1-4244-5541-6
    DOIs
    Publication statusPublished - 6 Jan 2010
    Event23th International Conference on VLSI Design, VLSID 2010 - Bangalore, India
    Duration: 3 Jan 20107 Jan 2010
    Conference number: 23

    Conference

    Conference23th International Conference on VLSI Design, VLSID 2010
    Abbreviated titleVLSID
    Country/TerritoryIndia
    CityBangalore
    Period3/01/107/01/10

    Keywords

    • METIS-275611
    • CMOS inverter
    • IR-75789
    • multiphase clock
    • EWI-18150
    • stage ratio
    • mismatch jitter
    • Tapering factor
    • figure of meri
    • Low power

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