Optimizing incomplete sample designs for item response model parameters

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Abstract

Several models for optimizing incomplete sample designs with respect to information on the item parameters are presented. The following cases are considered: (1) known ability parameters; (2) unknown ability parameters; (3) item sets with multiple ability scales; and (4) response models with multiple item parameters. The models are able to cope with hierarchical structures in the population of examinees as well as the domain of content, and allow for practical constraints with respect to such items as test content, curricular differences between groups, or time available for item administration. An example with test data from a national assessment study illustrates the use of the models. This methodology was applied to an imagined third study of the Dutch part of the Second Mathematics Study of the International Association for the Evaluation of Educational Achievement for the three subject areas of Geometry, Algebra, and Arithmetic for a sample of 400 seventh graders. The LANDO computer program was used to solve the models, illustrating their utility.
Original languageUndefined
Place of PublicationEnschede, the Netherlands
PublisherUniversity of Twente, Faculty Educational Science and Technology
Publication statusPublished - Apr 1988

Publication series

NameOMD research report
PublisherUniversity of Twente, Faculty of Educational Science and Technology
No.88-5

Keywords

  • Elementary Education
  • Elementary School Students
  • IR-103611
  • Grade 7
  • Sampling
  • Equations (Mathematics)
  • Computer Assisted Testing
  • Latent Trait Theory
  • Ability Identification
  • Mathematical Models
  • Mathematics Achievement
  • Maximum Likelihood Statistics
  • Foreign Countries
  • Statistical Analysis

Cite this

van der Linden, W. J. (1988). Optimizing incomplete sample designs for item response model parameters. (OMD research report; No. 88-5). Enschede, the Netherlands: University of Twente, Faculty Educational Science and Technology.