Optimizing Scan Test for Asynchronous Circuits

F.J. te Beest

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings ACiD Workshop, session 69
    Place of PublicationMunich, Germany
    Pages21-27
    Number of pages7
    Publication statusPublished - 2 Jan 2002

    Keywords

    • METIS-207531

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