Optimizing Scan Test for Asynchronous Circuits

F.J. te Beest

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings ACiD Workshop, session 69
    Place of PublicationMunich, Germany
    Pages21-27
    Number of pages7
    Publication statusPublished - 2 Jan 2002

    Keywords

    • METIS-207531

    Cite this

    te Beest, F. J. (2002). Optimizing Scan Test for Asynchronous Circuits. In Proceedings ACiD Workshop, session 69 (pp. 21-27). Munich, Germany.