The importance of signal-to-noise ratio (SNR) calculations for an optimum Fourier transform-infrared spectroscopy (FT-IR) detection of thin, isotropic layers on dielectric substrates is discussed; some illustrative examples are given. It is found that the SNR increases with increasing refractive index of the substrate whereas the use of p-polarized light is preferable. Optimum measurement conditions for oriented layers were found for a Ge substrate at an angle of incidence of 50–55°.
- Fourier transform infrared spectroscopy
- Monolayers and dielectric surfaces
Kosters, P. G. H., & Kooyman, R. P. H. (1998). Optimum IR measurement conditions for thin layers on dielectric surfaces. Thin solid films, 327(329), 283-286. https://doi.org/10.1016/S0040-6090(98)00645-2