Optimum IR measurement conditions for thin layers on dielectric surfaces

P.G.H. Kosters, R.P.H. Kooyman

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

The importance of signal-to-noise ratio (SNR) calculations for an optimum Fourier transform-infrared spectroscopy (FT-IR) detection of thin, isotropic layers on dielectric substrates is discussed; some illustrative examples are given. It is found that the SNR increases with increasing refractive index of the substrate whereas the use of p-polarized light is preferable. Optimum measurement conditions for oriented layers were found for a Ge substrate at an angle of incidence of 50–55°.
Original languageUndefined
Pages (from-to)283-286
Number of pages4
JournalThin solid films
Volume327
Issue number329
DOIs
Publication statusPublished - 1998

Keywords

  • IR-73900
  • METIS-128436
  • Fourier transform infrared spectroscopy
  • Monolayers and dielectric surfaces

Cite this