Optimum IR measurement conditions for thin layers on dielectric surfaces

P.G.H. Kosters; R.P.H. Kooyman

doi:10.1016/S0040-6090(98)00645-2

Optimum IR measurement conditions for thin layers on dielectric surfaces

P.G.H. Kosters, R.P.H. Kooyman

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Abstract

The importance of signal-to-noise ratio (SNR) calculations for an optimum Fourier transform-infrared spectroscopy (FT-IR) detection of thin, isotropic layers on dielectric substrates is discussed; some illustrative examples are given. It is found that the SNR increases with increasing refractive index of the substrate whereas the use of p-polarized light is preferable. Optimum measurement conditions for oriented layers were found for a Ge substrate at an angle of incidence of 50–55°.

Original language	Undefined
Pages (from-to)	283-286
Number of pages	4
Journal	Thin solid films
Volume	327
Issue number	329
DOIs	https://doi.org/10.1016/S0040-6090(98)00645-2
Publication status	Published - 1998

Keywords

IR-73900
METIS-128436
Fourier transform infrared spectroscopy
Monolayers and dielectric surfaces

Access to Document

10.1016/S0040-6090(98)00645-2

Cite this

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title = "Optimum IR measurement conditions for thin layers on dielectric surfaces",

abstract = "The importance of signal-to-noise ratio (SNR) calculations for an optimum Fourier transform-infrared spectroscopy (FT-IR) detection of thin, isotropic layers on dielectric substrates is discussed; some illustrative examples are given. It is found that the SNR increases with increasing refractive index of the substrate whereas the use of p-polarized light is preferable. Optimum measurement conditions for oriented layers were found for a Ge substrate at an angle of incidence of 50–55°.",

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T1 - Optimum IR measurement conditions for thin layers on dielectric surfaces

AU - Kosters, P.G.H.

AU - Kooyman, R.P.H.

PY - 1998

Y1 - 1998

N2 - The importance of signal-to-noise ratio (SNR) calculations for an optimum Fourier transform-infrared spectroscopy (FT-IR) detection of thin, isotropic layers on dielectric substrates is discussed; some illustrative examples are given. It is found that the SNR increases with increasing refractive index of the substrate whereas the use of p-polarized light is preferable. Optimum measurement conditions for oriented layers were found for a Ge substrate at an angle of incidence of 50–55°.

AB - The importance of signal-to-noise ratio (SNR) calculations for an optimum Fourier transform-infrared spectroscopy (FT-IR) detection of thin, isotropic layers on dielectric substrates is discussed; some illustrative examples are given. It is found that the SNR increases with increasing refractive index of the substrate whereas the use of p-polarized light is preferable. Optimum measurement conditions for oriented layers were found for a Ge substrate at an angle of incidence of 50–55°.

KW - IR-73900

KW - METIS-128436

KW - Fourier transform infrared spectroscopy

KW - Monolayers and dielectric surfaces

U2 - 10.1016/S0040-6090(98)00645-2

DO - 10.1016/S0040-6090(98)00645-2

M3 - Article

SN - 0040-6090

VL - 327

SP - 283

EP - 286

JO - Thin solid films

JF - Thin solid films

IS - 329

ER -